宽带GaAs三栅MESFET开关模型

提出一种三栅MESFET开关的模型--附加栅控开关模型,模型是根据三栅MESFET开关器件的结构,考虑了栅极对微波信号的影响,适用于MMIC开关电路的设计,具有很好的宽带微波特性.器件测试值与模型模拟值吻合较好.     

宽带GaAs三栅MESFET开关模型

提出一种三栅MESFET开关的模型--附加栅控开关模型,模型是根据三栅MESFET开关器件的结构,考虑了栅极对微波信号的影响,适用于MMIC开关电路的设计,具有很好的宽带微波特性.器件测试值与模型模拟值吻合较好.     

宽带GaAs MESFET开关模型

提出了一种 MESFET开关的模型——附加栅控开关模型 ,适用于 MMIC电路的设计 ,具有很好的宽带微波特性。在 0 .1～ 2 0 GHz频率范围内 ,器件测试值与模型模拟值吻合较好     

负载牵引法在开关类功率放大器设计中的应用

为提高开关类功率放大器设计的准确性,找出功放管的最优输出阻抗值,采用负载牵引法设计开关类功率放大器,得到最佳输出阻抗值,然后设计输出及输入匹配网络及谐波抑制网络,仿真结果输入功率为28dBm时,功率附加效率达到69．352％,表明功率负载牵引方法为改进开关类放大器设计,优化开关类功放管性能提供了快速而有效的方法,提高了大信号下模型的准确性。     

基于RT器件的三值与非门、或非门电路设计

共振隧穿（resonant tunnel,RT）器件本身所具有的微分负阻（negative differential resistance,NDR）特性使其成为天然的多值器件，文中利用RT器件的负阻特性,以开关序列原理为指导,设计了基于RT电路的开关模型,实现了更为简单的三值RT与非门和或非门电路,并利用MOS网络模型,通过SPICE软件仿真验证了所设计电路的正确性，该设计思想可推广到更高值的多值电路设计中。     

基于RT器件的三值与非门、或非门电路设计

共振隧穿(resonant tunnel,RT)器件本身所具有的微分负阻(negative differential resistance,NDR)特性使其成为天然的多值器件.文中利用RT器件的负阻特性,以开关序列原理为指导,设计了基于RT电路的开关模型,实现了更为简单的三值RT与非门和或非门电路,并利用MOS网络模型,通过SPICE软件仿真验证了所设计电路的正确性.该设计思想可推广到更高值的多值电路设计中.     

改进型三值RTD量化器的设计

共振隧穿二极管RTD本身所特有的负阻微分特性使其成为天然的多值器件。介绍了三值RTD和三值RTD+HEMT的伏安特性以及三值RTD量化器和开关序列的工作原理,以RTD开关序列模型为指导思想设计出改进型三值RTD量化器电路,比原电路结构简单,仿真结果验证了设计的正确性。该设计方法不仅可以用于实现更简单和更灵活的三值RTD量化器,还能用于更高值的多值RTD逻辑电路的设计中。     

基于开关电容技术的巴特沃斯滤波器设计及PSpice仿真研究

应用开关电容技术对四阶巴特沃斯滤波电路进行变换和简化,设计了一个集成式巴特沃斯滤波电路。该设计运用LF411运算放大器及开关电容时域宏模型,开关电容的时钟频率可调,可以构成多阶多截止频率的滤波器。PSpice仿真说明,其结果与理论计算值基本一致,可为以后的设计研究提供充分的依据。     

多层封装基板中同步开关噪声研究

文章以栅格阵列封装(land grid array,LGA)模型为研究对象,分析了多层封装基板中的同步开关噪声(simultaneous switching noise,SSN)问题。首先利用频域仿真工具PowerSI得到了键合线和信号布线的S参数模型。然后通过在电路仿真工具HSPICE中加载封装结构的S参数模型和驱动器模型来仿真同步开关噪声。最后在设计中选取在多层基板上添加去耦电容的方式来减小同步开关噪声。仿真结果表明,通过在本LGA多层基板设计中添加110pF容值的去耦电容,可以较好地减少同步开关噪声,满足设计要求。     

利用开关电容技术的50Hz抑制滤波器及其PSpice仿真研究

文中对 2 912PCM双信道滤波电路进行了讨论 ,应用开关电容电路技术 ,将其进行变换和必要的简化。设计了集成 5 0Hz抑制滤波器电路 ,运用LM 12 4运算放大器及开关电容时域宏模型 ,开关电容的时钟频率选为 12 8kHz进行计算机模拟 ,其结果与理论计算值一致     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Teleportation of an arbitrary unknown N-qubit entangled state under the controlling of M controllers

A new quantum protocol to teleport an arbitrary unknown N-qubit entangled state from a sender to a fixed receiver under M controllers(M < N) is proposed. The quantum resources required are M non-maximally entangled Greenberger-Home-Zeilinger (GHZ) state and N-M non-maximally entangled Einstein-Podolsky-Rosen (EPR) pairs. The sender performs N generalized Bell-state measurements on the 2N particles. Controllers take M single-particle measurement along x-axis, and the receiver needs to introduce one auxiliary two-level particle to extract quantum information probabilistically with the fidelity unit if controllers cooperate with it.     

Diode-end-pumped Nd:YVO4/LBO lasers with 4.2W continuous-wave output at 457 nm

A continuous-wave (CW) 457 nm blue laser operating at the power of 4.2 W is demonstrated by using a fiber coupled laser diode module pumped Nd: YVO4 and using LBO as the intra-cavity SHG crystal With the optimization of laser cavity and crystal parameters, the laser operates at a very high efficiency. When the pumping power is about 31 W, the output at 457nm reaches 4.2 W, and the optical to optical conversion efficiency is about 13.5% accordingly. The stability of the out putpower is better than 1.2% for 8 h continuously working.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.