一种新型盲均衡算法－RG算法的研究

本文提出了一种新的盲均衡算法－ＲＧ算法，它保持了Ｇｏｄａｒｄ盲均衡算法收敛性能好的特点，其误码性能也优于Ｇｏｄａｒｄ盲均衡算法，尤其是对ＭＰＳＫ调制系统。理论分析及计算机模拟表明，ＲＧ算法是一种性能优良的盲均衡算法。     

一种适用于MPSK调制的混合型盲均衡算法

提出了一种特别适用于ＭＰＳＫ信号的混合型盲均衡算法，理论分析和计算机模拟表明，这种混合型盲均衡算法的收敛性能与Ｇｏｄａｒｄ类盲均衡算法的收敛性能相同，而误码性能优于Ｇｏｄａｒｄ类盲均衡算法，并接近系统ＬＭＳ均衡算法的性能，是一种具有实用价值的盲均衡算法。     

一种新型盲均衡算法—RG算法的研究

本文提出了一种新的盲均衡算法－ＲＧ算法，它保持了Ｇｏｄａｒｄ盲均衡算法收敛性能好的特点，其误码性能也优于Ｇｏｄａｒｄ盲均衡算法，尤其是对ＭＰＳＫ调制系统。理论分析及计算机模拟表明，ＲＧ算法是一种性能优良的盲均衡算法。     

“Stop and Go”判决引导算法中β的选择及其动量算法

本文在分析“ｓｔｏｐ ａｎｄ ｇｏ”判决引导算法的基础上，提出了一种选取β的方法，该方法保证对不同的信号和信道“ｓｔｏｐ ａｎｄ ｇｏ”判决引导（ＤＤ）算法都能快速收敛，为了提高“ｓｔｏｐ ａｎｄ ｇｏ”ＤＤ算法的收敛速度，提出了一种自适应动量“ｓｔｏｐ ａｎｄ ｇｏ”ＤＤ算法，该算法比“ｓｔｏｐ ａｎｄ ｇｏ”算法的收敛速度更快。     

一种新的盲均衡算法

本文提出一种适合于ＰＡＭ、ＱＡＭ数字通信系统的新的盲均衡算法。该算法克服了Ｓａｔｏ、ＲＣＡ、ＣＭＡ等算法收敛后剩余误差大和ＢＧ、Ｓｔｏｐ ａｎｄ Ｇｏ等算法中有待定参数的缺点。     

一种适用于MQAM调制的变步长判决引导的盲均衡算法

本文对一种新的代价函数作了研究，提出一种适用于ＭＱＡＭ调制信号的变步长的判决引导的盲均衡算法。理论分析和计算机模拟表明变步长判决引导的盲均衡算法的收敛性能及误码性能均优于ＣＭＡ算法，并与传统的ＬＭＳ均衡算法的性能一致，是一种很实用的均衡算法。     

常模类盲均衡算法的研究

讨论了常模类自适应盲均衡技术,总结了改进和设计常模类盲均衡算法的思路,在常模算法代价函数的基础上给出了一种变步长多模算法.计算机仿真表明,此算法收敛速度较快、收敛后稳态误差较小,具有很好的实用性.     

基于误差反馈的变步长LMS自适应滤波算法

对变步长LMS滤波算法进行研究,提出一种新的变步长LMS自适应滤波算法。该算法基于Sigmoid函数,通过引入误差因子反馈来调整函数参数,解决了类Sigmoid函数中参数设置的问题,并使算法具有较快的收敛速度和较小的稳态误差。计算机仿真表明,相对于其他变步长算法,该算法在收敛速度和稳态误差方面均表现优异,具有较好适用性。     

一种T/2分数间隔的变步长盲均衡算法

针对算法固定步长存在收敛速度和剩余误差的性能要求相矛盾的问题,在深入研究分数间隔均衡器(FSE)和修正常模算法的基础上,研究了一种变步长盲均衡算法。该算法利用了与误差函数的非线性函数关系自适应调整步长。利用QPSK信号,对固定步长和变步长的T/2分数间隔修正常模算法进行仿真,结果表明以变步长的盲均衡算法能够提高收敛速度和降低剩余误差,有效地改进了信道均衡性能。     

变步长常数模盲均衡算法研究

为了进一步提高CMA盲均衡算法的收敛速度和均衡性能,研究了一种变步长常数模盲均衡算法.常数模盲均衡算法中,步长参数直接影响算法的收敛速度和均衡性能,合理的选择步长参数不仅能够避免算法发散或收敛过慢,并且适时调整步长参数可以避免算法陷入局部极小值.高阶均方误差直接反映算法的收敛状态,所以可以利用高阶均方误差作为步长参数的调整因子.计算机仿真表明以高阶均方误差作为步长参数调整因子使常数模盲均衡算法具有了更快的收敛速度和更好的均衡效果.     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.