光电目标图像自动跟踪技术研究

概括介绍了相关跟踪、特征跟踪和对比度跟踪等技术,根据各种复杂环境下的算法适应性的需要,提出了一种改进的相关跟踪算法,即对图像进行粗采样预处理,降低匹配图像的分辨率,再进行图像归一化分区域相关匹配算法.实验证明,此方法有效地提高了算法的适应性.     

地面复杂场景图像相关跟踪算法研究

提出了一种性能良好的快速图像相关跟踪算法，利用视频图像序列帧间及帧内的相关性，采用空间及灰度多尺度分解算法，减少匹配算法的运算量和提高目标定位精度，建立相关跟踪置信度评估、模板自适应刷新、相似目标辨识等准则，有效地提高目标跟踪的稳定性和鲁棒性。实验结果表明，该算法能够较好地实现各种复杂场景条件下的目标稳定跟踪。     

基于分层模板的目标实时跟踪算法

在数字图像处理领域里,相关匹配技术有着广泛的应用,尤其在目标搜索和跟踪应用中.相关匹配算法通过计算目标图像与模板图像的相关值来确定是否图像和模板相关,具有很高的跟踪准确性和稳定性,但当目标仅占模板一小部分时,普通相关匹配算法效果很差.分析了有关相关跟踪算法的特点,提出了分层模板匹配的算法,并应用在实际的工程应用系统中;通过实验证明,该算法能较好地改善对小目标的跟踪效果,并可以克服障碍物对目标的部分遮挡问题.     

结合分形特征及灰度相关的快速样本图像匹配算法

样本图像的匹配广泛应用于图像的判读、情报的获取和目标识别等方面.基于图像区域和纹理特征的样本匹配算法由于不需要进行特征提取而成为研究的热点.但是这类方法计算复杂,实时性比较差.为此,本文提出了一种结合分形特征和灰度相关的由粗到精的样本图像匹配算法,并且提出了分形特征计算的快速计算方法.算法首先计算样本图像和原图像各像素点对应的分形特征值;然后利用分形特征进行样本图像的粗匹配,得到初步的配准结果;最后,利用灰度相关剔除粗匹配中错误的匹配区域,得到最后的匹配结果.大量实验表面,本文提出的算法是有效的.     

一种基于曲线拟合预测的红外目标的跟踪算法

给出了一种将曲线拟合和相关跟踪相结合的红外目标跟踪算法。该算法以目标质心作为匹配模板的中心，采用SSDA进行相关运算，以图像相关匹配的输出值更新所拟合的曲线，并以曲线的预测值作为下帧图像匹配搜索的初始值，使相关运算仅在很小的窗口内进行。该算法还定义了跟踪的帧内置信度和帧间置信度信号，实时智能的更新模板。实验表明，该算法能有效减少相关匹配的计算量，保证跟踪精度。     

SSDA的改进算法

针对传统相关匹配算法不能满足实时性的缺点,通过分析红外图像目标的特点,提出一种改进的SSDA算法,充分利用图像的边缘特征和灰度信息,在没有降低匹配精度的情况下减少了计算量,单调递减阈值序列的使用,进一步提高了算法的速度.     

MCD-SSDA匹配方法研究

MCD相关匹配是针对模板相关匹配算法中存在的缺点提出的一种新的图像相似度度量方法，即将目标图像中与模板图像相接近的点的个数作为相似度量来进行匹配，该方法已验证具有相关曲面尖锐，置信度高的特点．考虑到硬件实现及实时性的需要，在分析了经典的SSDA算法的基础上，重新对MCD表达式进行定义并提出了MCD—SSDA匹配方法，经Matlab仿真实验后证明该方法具有优越性．     

一种新的基于梯度特征的快速相关匹配算法

文中定义了一种基于梯度纹理的新特征，并以目标模板与实时图像的新特征差异为相似性度量，提出了一种新的相关匹配算法。与工程上常用的MAD相关匹配算法相比，本算法相似度曲面更尖锐，匹配时间短，置信度高，适合应用于红外图像实时跟踪系统中。实验结果表明了该算法的有效性和优越性。     

结合相位和ＳＩＦＴ特征相关的图像自动配准算法

提出一种鲁棒性较好的图像配准算法解决乱序输入图像序列自动拼接问题。首先为输入图像建立多分辨率金字塔,在较低分辨率图像层上进行相位相关区域搜索;接着对得到的相关区域进行SIFT特征相关验证,得到图像序列的配准关系和透视变换矩阵的初步估计;然后结合估计参数对原始图像的SIFT特征再次进行相关匹配,最终实现图像序列变换参数的精确求解。该算法结合相位相关和SIFT特征相关两种配准算法的优点并应用由粗到精的匹配策略提高了图像配准的速度和稳定性。     

任意指定地面复杂场景图像目标的去均值相关跟踪算法

本文通过对相关系数作为相似性度量准则的匹配跟踪算法的改进,提出了去均值相关跟踪算法,采用网格搜索法进行粗匹配,以邻域法进行精匹配,减少了算法的计算量,满足机载成像光电吊舱系统目标跟踪的实时性要求。提出了自适应模板更新方法和修正的自适应模板更新方法,并对这两种方法进行仿真比较,实验表明,修正的自适应模板更新方法具有更高的跟踪精度和更好的跟踪稳定性。     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.