共查询到20条相似文献,搜索用时 78 毫秒
1.
数字水印技术是一种重要的知识产权核(IP)保护技术,也是应用最广泛的IP核保护技术。介绍了常用的数字水印生成方法,分析了在FPGA设计的各个层面(软核、固核、硬核)的IP核数字水印技术。IP核保护数字水印技术可以分为附加保护技术、约束保护技术和检测技术,从附加和约束两个方面分析了水印嵌入技术,介绍了水印检测技术,分析了各种方法的原理和优缺点。从性能影响、资源开销、透明性、安全性、可信度等5个方面,对几种典型的水印技术进行评估比较,最后指出数字水印技术需要解决的问题和发展趋势。 相似文献
2.
IP承载网技术新动态 总被引:1,自引:0,他引:1
介绍了IP承载网技术的概念,分析了IP承载网技术的热点技术——位置标识和身份标志分离技术、电信级以太网技术以及深度包检测(DPI)技术,以及在IP层之上、应用层之下构建的新的、独立于特定应用的(弹性)重叠网的研究进展。 相似文献
3.
4.
当前高速串行通信技术已被广泛地应用于电子、计算机等各个领域,高速信号质量的好坏决定了整个系统的好坏,因此对高速信号的验证变得极其重要。现场可编程门阵列(FPGA)作为高速串行通信中不可取代的高性能新品,对电子信息系统的先进性、安全性和可靠性起到决定性作用。FPGA内部集成多个高速知识产权(IP),因此对FPGA的高速IP进行验证测试变得尤为重要。通过误码率测试仪(IBERT)核来监控和评估高速IP,介绍了IBERT的基本功能、实现方法,以及高速串行收发器(GTX)的工作原理和验证方法。同时基于KC705平台搭建验证环境,使用IBERT核调整激励参数,对FPGA的高速串行接口进行验证,并对其误码、抖动和眼图进行详细的分析。实验证明,该方法大大地提高了IP的评估质量和效率。 相似文献
5.
6.
7.
《世界电子元器件》2008,(6):53
Synplicity推出System Desjgne——一款独立于器件的知识产权(1P)配置技术与系统级汇编环境,是Synplicity的Synplify Pro与Synplify Premier FPGA设计实施工具中的新成员。System Designer的功能使用户得以使用IP-XACT形式选择、配置并集成内部及第三方IP,并且在Actel、Altera、Lattice Semiconductor和Xilinx等众多不同FPGA产品中轻松实现。这种全新的工具流程为采用IP和系统级模块的FPGA设计人员在实现复杂FPGA系统时提供了一种高效的途径。 相似文献
8.
9.
10.
今天,系统级芯片(SoC)设计师在产品开发中面临的最重要的问题之一,就是如何选择一个知识产权(IP)内核。它能够影响产品的性能和质量,以及上市时间和盈利能力。然而SoC设计师在选择一个内核的时候面临着诸多挑战。他们需要仔细考虑以决定哪种内核对特定的SoC最合适。他们必须决定内核的类型(软内核或是硬内核)、可交付成果的质量、可靠性和IP提供商的承诺等等。本文将就以上每个环节进行讨论,并为如何最好地评估多个相互竞争的IP内核的特性提供一个指导。 相似文献
11.
Meihua Shen Wilfred Pau Nicolas Gani Jianping Wen Shashank Deshmukh Thorsten Lill Jian Zhang Hanming Wu Guqing Xing 《半导体技术》2004,29(8)
This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration. 相似文献
12.
White organic light-emitting devices based on fac tris(2- phenylpyridine) iridium sensitized 5,6,11,12-tetraphenylnap -hthacene 总被引:1,自引:0,他引:1
We have fabricated the white organic light-emitting devices (WOLEDs) based on 4,4' -bis(2,2 -diphenyl vinyl)-1,1' - biphenyl (DPVBi) and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene (rubrene). The device structure is ITO/2T-NATA (20 nm)/NPBX (20 nm)/CBP: x%Ir(ppy)3:0.5% rubrene (8 nm)/NPBX (5 nm)/DPVBi (30 nm)/Alq(30 nm)/LiF(0.5 nm)/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris (2-phenylpyridine) iridium [Ir(ppy)3], acts as a yellow light-emitting layer, and N,N' -bis- (1-naphthyl)- N,N' -diphenyl -1, 1' -biphenyl-4,4' -diamine (NPBX) acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir (PPY)3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V. 相似文献
13.
Complete approach to automatic identification and subpixel center location for ellipse feature 总被引:1,自引:0,他引:1
XUE Ting WU Bin SUN Mei YE Sheng-hua 《光电子快报》2008,4(1):51-54
To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction. 相似文献
14.
15.
In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal (200) (2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line(w), the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line(x), the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines(y), the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line(z) in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line(q) in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution(λ/△ 2) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy. 相似文献
16.
High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET > PDMAT > TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center. 相似文献
17.
Credence Systems Corporation 《半导体技术》2004,29(9)
Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V. 相似文献
18.
This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors. 相似文献
19.
YUXiao-hua XIANGYu-qun 《半导体技术》2005,30(2):30-32,37
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB. 相似文献
20.
It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer (LDV). 相似文献