实用电子仿真工作平台简介

文章介绍了一个实用的电子仿真工作平台ＥｌｅｃｔｒｏｎｉｃＷｏｒｋｂｅａｃｈ，它能设计调试电子仿真实验，还可将成功的电子实验线路生成自动布线的印刷电路板。     

薄膜开关在自动BLU叠片机生产调试中的应用

自动BLU叠片机主要用于背光单元制作过程中各种导光膜的叠放，在叠合过程中，各种导光膜的特性不同，叠放工艺也各不相同，设备运作繁琐，生产调试技术难度高，耗时费力。为此我们设计了薄膜开关组，结合软件开发，成功优化了自动BLU叠片机设备生产调试过程，提高了生产效率。     

可视化增强技术优化芯片后期验证和调试

在芯片验证、仿真和全芯片模拟的过程中,为了调试复杂问题,可视化增强技术能够方便地获得所需要的足够信号信息。它能够通过对设计的自动分析来确定哪些是重要信号,扩展没有被捕获的信号,并将低级别描述中的信号与RTL级描述中的信号相关联,这些都有助于对设计的全面理解,从而大大减少调试时间。     

现代电子电路设计制作方法

<正> 随着集成电路技术的飞速发展和微机的普及应用,电子电路的设计制作进入了一个新阶段,出现了新的设计制作方法。为与以往传统的电子电路制作方法区别开来,我们称之为现代电子电路设计制作方法。运用现代电子电路设计制作方法,可将以往由许多标准的数字电路和模拟电路组成的系统制作成一二片在家中即可设计的大规模集成电路,可将复杂的印刷电路板设计,变成从电原理图中提取电路联接关系(这种联接关系称为网表),快速地自动生成印刷电路板图,可将以往使用信号源和仪器对电路板进行的复杂调试工作,变成用微机软件仿真调试,还可将使用普通仪器进行的多次调试变成使用智能仪器的高效调试。总之,在现代电子电路的开发与设计中,以往许多在实验室中进行的手工焊接、调试工作,变成了使用微机软件的仿真工作。     

基于Proteus的自动拨号报警器仿真设计

利用嵌入式系统仿真软件Proteus实现了基于AT89C51单片机的自动拨号报警器仿真设计。详细分析自动拨号报警器的硬件设计原理,并在Keil开发环境下设计了对应的驱动程序,在Proteus中完成了软、硬件的联合仿真调试,最后给出了仿真运行结果。通过Proteus软件的前期仿真,大大缩短了实际开发周期,降低开发成本,对于单片机应用系统、电子电路的开发和教学等都有较大的实用价值,且设计的电路及驱动程序对相应的实际应用系统具有一定的借鉴作用。     

RFID储能天线的仿真与调试方法

分析了射频识别（RFID）储能天线的工作原理，用史密斯圆图软件对阻抗匹配电路进行了设计和仿真，并结合实践经验对天线的调试方法作了总结。     

基于Petri网的耳机部件自动装配设备PLC控制系统研究

为解决在具有并发、竞争控制的PLC控制系统中传统的PLC程序设计方法存在不适用,而且易导致程序出错并且难以检查错误等问题,利用Petri网具有图形描述、模拟特点以及分析具有并发和冲突环节等复杂事件的能力,结合Petri网的建模方法与ExSpect模型仿真技术对耳机部件自动装配设备控制系统进行建模与仿真分析,然后利用仿真结果再结合工艺流程,直观地指导构建PLC 控制系统的程序。仿真与调试结果表明：该方法可避免设备运行时相关部件的冲撞等实际问题,缩短调试时间,保证了PLC控制系统可行、可靠性。     

“虚实结合”的EDA课程设计实验教学案例

为提高学生的工程实践能力,我校EDA课程设计结合自研在线教学平台,采用案例式教学方式,锻炼和培养学生对EDA开发工具综合运用的能力和动手实践能力。EDA课程案例包括Matlab设计仿真、Modelsim仿真及D/A电路设计调试等EDA完整工程设计流程,线上实验平台提供远程硬件调试功能,学生可以随时随地通过线上实验平台对设计进行验证并与教师进行在线交流。该案例的成功实施有助于虚实结合的实践教学方法探索。     

开放式柔性测控实验平台的设计与实现

结合江苏省自动化品牌专业和学生创新能力与工程综合应用能力培养实验基地建设，我们自行设计、研发了一种具有开放性和柔性特点的测控实验平台，本文详细介绍了该平台的设计思路、设计方法以及相关技术。该平台可直接与多种（常见类型）传感器连接，可设计、选用不同的信号调理和数据采集方案，灵活构建完整的智能化测控系统。其内置仿真调试和程序固化功能，支持Keilu Vision2环境下程序的开发调试；可作为不同基础和能力层次的自动化类本科生、研究生的综合性的设计型通用实验平台。     

具有测试功能机载雷达软件仿真系统

描述供机载雷达应用软件调试，测试用的软件仿真系统，它不但能仿真雷达应用软件的运行环境，可用于设计，调试应用软件，还实现了对雷达软件的功能及性能测试，提高了机载雷达软件的质量。     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.