一种具有采样带宽补偿的高性能采样/保持电路

针对中频采样模数装换器中的宽带采样/保持电路,提出了一种新颖的电荷交换补偿（CEC）技术.该技术通过消除采样开关有限导通电阻的影响,补偿了采样带宽,并避免了时钟馈通和电荷注入的加剧.同时设计了具有AB类输出的低功耗两级运放,在1.8V电源下为该采样/保持提供了3V峰-峰值的输入范围.该采样/保持电路在100Ms/s的采样率下,对于200MHz输入信号达到了94dB的无杂散动态范围.在5.5pF的负载下,功耗仅为26mW.     

用于14位210 MS/s电荷域ADC的采样保持前端电路

该文提出一种用于电荷域流水线模数转换器(ADC)的高精度输入共模电平不敏感采样保持前端电路。该采样保持电路可对电荷域流水线ADC中由输入共模电平误差引起的共模电荷误差进行补偿。所提出的高精度输入共模电平不敏感采样保持电路被运用于一款14位210 MS/s电荷域ADC中,并在1P6M 0.18 μm CMOS工艺下实现。测试结果显示,该14位ADC电路在210 MS/s条件下对于30.1 MHz单音正弦输入信号得到的无杂散动态范围为85.4 dBc,信噪比为71.5 dBFS,而ADC内核功耗仅为205 mW,面积为3.2 mm2。     

一种采用双采样技术的高性能采样保持电路

介绍了一种高性能的采样保持电路。他采用双采样结构,使得在同样性能的运算放大器条件下,采样速率成倍提高,降低对运放的要求;使用补偿技术的两级运算放大器有较高增益和输出摆幅;采用栅压自举电路,消除开关导通电阻的非线性,减小电荷注入效应和时钟溃通。在SMIC 0.25μm标准工艺库下仿真,该采样保持电路可试用于高速高精度流水线ADC。     

一种12位100MSPS采样保持电路的设计

基于0.13μm/3.3V CMOS工艺,设计了一种用于12bit 100MSPS Pipeline AIC的采样保持(S/H)电路.采用具有高线性度双边对称的无馈通自举采样开关,获得高增益、宽带宽的跨导前馈补偿共源共栅两级全差分跨导放大器,以及能显著降低增益误差的相关双采样S/H拓扑结构来搭建S/H电路.仿真结果表明:当在11.27MHz的输入信号,111MHz的采样信号下,该S/H电路无杂散动态范围(SFDR)86.4dB,功耗为32mW.     

5 Msample/s两倍增益差分采样/保持电路的设计和分析

设计和分析了一种用于10位分辨率,5 MHz采样频率流水线式模数转换器中的差分采样/保持电路.该电路是采用电容下极板采样、开关栅电压自举、折叠式共源共栅技术进行设计,有效地消除了开关管的电荷注入效应、时钟馈通效应引起的采样信号的误差,提高了采样电路的线性度,节省了芯片面积、功耗.电路是在0.6 μm CMOS工艺下进行模拟仿真,当输入正弦波频率为500 kHz,采样频率为5 MHz时,电路地无杂散动态范围(SFDR)为75.4 dB,能够很好的提高电路的信噪比,因此该电路适用于流水线式模数转换器.     

一种用于流水线ADC采样保持电路的设计

介绍一种用于流水线ADC的采样保持电路。该电路选取电容翻转式电路结构,不仅提高整体的转换速度,而且减少因电容匹配引起的失真误差;同时使用栅压自举采样开关,有效地减少了时钟馈通和电荷注入效应;采用全差分运算放大器能有效的抑制噪声并提高整体的线性度。该采样保持电路的设计是在0.5μm CMOS工艺下实现,电源电压为5 V,采样频率为10 MHz,输入信号频率为1 MHz时,输出信号无杂散动态范围(SFDR)为73.4 dB,功耗约为20 mW。     

适用于12 bit流水线ADC采样保持电路的设计

介绍了一种用于12 bit,20 MS/s流水线模数转换器前端的高性能采样/保持电路。该电路采用全差分结构、底极板采样来消除电荷注入和时钟馈通误差。采用栅压自举开关,并通过对电路中的开关进行组合优化,极大地提高了电路的线性性能。同时,运算放大器采用折叠式增益增强结构,以获得较高的增益和带宽。采用CSMC公司的0.5μm CMOS工艺库,对电路进行了仿真和流片。结果表明,在5 V电源电压下,采样频率为20 MHz,采样精度可达到0.012%,在输入信号为奈奎斯特频率时,无杂散动态范围(SFDR)为76 dB。     

一种高线性度超宽带采样/保持电路

设计了一种桥式并-串联级联结构的高线性度、超宽带采样/保持电路。该采样/保持电路包括输入缓冲器、辅助开关和SEF开关三个单元。采用桥式并-串联级联结构改进的辅助开关模块单元,大幅提高了电路的线性度和带宽。该采样保持电路基于0.13 μm SiGe双极型工艺进行设计,-4.75 V和2 V双电源电压供电。仿真结果表明,在100 fF采样电容、6.25 GHz采样频率、10.28 GHz输入频率的条件下,SFDR为69.60 dB,THD为-65.25 dB,-3 dB带宽达 35.43 GHz。     

一种用于14bit 50MHz流水线模数转换器的CMOS采样开关

分析了影响CMOS采样开关性能的非理想因素,针对14bit 50MHz A/D转换器对采样开关特性的要求,提出了一种新型的时钟馈通补偿结构.该结构通过增加dummy开关管能够有效消除时钟馈通对采样值的影响,打破了开关设计中速度和精度之间的制约关系.基于SMIC 0.25μm标准CMOS数模混合工艺,采用Hspice对电路进行了模拟.模拟结果显示,在输入信号为23.3MHz正弦波,峰峰值为2V,采样时钟频率为50MHz,时钟上升/下降时间为0.1ns时,无杂散动态范围达到92dB,信噪失真比达到83dB;同时时钟馈通效应造成的保持误差由5.5mV降为90μV.这种具有时钟馈通补偿结构的采样开关特别适用于高速高分辨率模数转换器.     

一种用于14bit 50MHz流水线模数转换器的CMOS采样开关

分析了影响CMOS采样开关性能的非理想因素,针对14bit 50MHz A/D转换器对采样开关特性的要求,提出了一种新型的时钟馈通补偿结构.该结构通过增加dummy开关管能够有效消除时钟馈通对采样值的影响,打破了开关设计中速度和精度之间的制约关系.基于SMIC 0.25μm标准CMOS数模混合工艺,采用Hspice对电路进行了模拟.模拟结果显示,在输入信号为23.3MHz正弦波,峰峰值为2V,采样时钟频率为50MHz,时钟上升/下降时间为0.1ns时,无杂散动态范围达到92dB,信噪失真比达到83dB;同时时钟馈通效应造成的保持误差由5.5mV降为90μV.这种具有时钟馈通补偿结构的采样开关特别适用于高速高分辨率模数转换器.     

A new high-speed, high-resolution open-loop CMOS sample and hold

A new open loop, high resolution CMOS sample and hold (S/H) circuit is introduced in this article. This circuit is constructed based on a new method which leads to a great reduction in dependency of the storing charge of the holding capacitors to the charge injection of transistors. It is a combination of dummy switches and auxiliary capacitors in order to decrease the voltage spikes that are produced during the sampling mode. Due to the high linearity feature of our proposed design in comparison with previous works, it is reached to a great improvement in signal to noise and distortion ratio up to about 15 dB and it’s ENOB is equivalent with about 16 bits. Another advantages of our proposed design are it’s lower power dissipation and it’s high input voltage range. Also the optimum functionality of our proposed circuit does not damaged by the threshold voltage’s variations in different corners. As our proposed S/H circuit has been designed in open loop structure, it is suitable for high speed applications.     

A High Performance Track and Hold Circuit for High-Resolution High-Speed ADC

Design of a high performance track and hold (T/H) circuit for high-resolution high-speed analog-to-digital converter (ADC) is presented,which has been implemented in 0.18 μm CMOS process.An improved bootstrapped and bulk-switching technique is introduced to greatly minimize the nonlinearity of sampling network over a wide bandwidth,and the addition of a modified pre-charge circuit helps reducing the total power consumption.The experimental results show that the proposed T/H circuit achieves over 77 dB SFDR (spurious-free dynamic range) and 70 dB THD (total harmonic distortion) at 100 MHz sampling rate and maintains the performance with input frequency up to 305 MHz while consuming 47 mW power.     

A 10 b, 20 Msample/s, 35 mW pipeline A/D converter

This paper describes a 10 b, 20 Msample/s pipeline A/D converter implemented in 1.2 μm CMOS technology which achieves a power dissipation of 35 mW at full speed operation. Circuit techniques used to achieve this level of power dissipation include digital correction to allow the use of dynamic comparators, and optimum scaling of capacitor values through the pipeline. Also, to be compatible with low voltage mixed-signal system environments, a switched capacitor (SC) circuit in each pipeline stage is implemented and operated at 3.3 V with a new high-speed, low-voltage operational amplifier and charge pump circuits. Measured performance includes 0.6 LSB of INL, 59.1 dB of SNDR (Signal-to-Noise-plus-Distortion-Ratio) for 100 kHz input at 20 Msample/s. At Nyquist sampling (10 MHz input) SNDR is 55.0 dB. Differential input range is ±1 V, and measured input referred RMS noise is 220 μV. The power dissipation at 1 MS/s is below 3 mW with 58 dB of SNDR     

A 10-b 20-Msample/s low-power CMOS ADC

A single-ended input but internally differential 10 b, 20 Msample/s pipelined analog-to-digital converter (ADC) is demonstrated with 4 mW per stage using a single 5 V supply. The prototype ADC made of an input sample and hold (S/H) plus 8 identical unscaled pipelined stages consumes 50 mW including power consumed by a bias generator and two internal buffer amplifiers driving common-mode bias lines. Key circuits developed for this low-power ADC are a dynamic comparator with a capacitive reference voltage divider that consumes no static power, a source-follower buffered op amp that achieves wide bandwidth using large input devices, and a self-biased cascode biasing circuit that tracks power supply variation. The ADC implemented using a double-poly 1.2 μm CMOS technology exhibits a DNL of ±0.65 LSB and a SNDR of 54 dB while sampling at 20 MHz. The chip die area is 13 mm²     

A 10-bit 50-MS/s sample-and-hold circuit with low distortion sampling switches

A fully-differential switched-capacitor sample-and-hold (S/H) circuit used in a 10-bit 50-MS/s pipeline analog-to-digital converter (ADC) was designed and fabricated using a 0.35-μm CMOS process. Capacitor fliparound architecture was used in the S/H circuit to lower the power consumption. In addition, a gain-boosted operational transconductance amplifier (OTA) was designed with a DC gain of 94 dB and a unit gain bandwidth of 460 MHz at a phase margin of 63 degree, which matches the S/H circuit. A novel double-side bootstrapped switch was used, improving the precision of the whole circuit. The measured results have shown that the S/H circuit reaches a spurious free dynamic range (SFDR) of 67 dB and a signal-to-noise ratio (SNR) of 62.1 dB for a 2.5 MHz input signal with 50 MS/s sampling rate. The 0.12 mm2 S/H circuit operates from a 3.3 V supply and consumes 13.6 mW.     

High-performance CMOS buffered gate modulation input (BGMI) readoutcircuits for IR FPA

A new CMOS current readout structure for the infrared (IR) focal-plane-array (FPA), called the buffered gate modulation input (BGMI) circuit, is proposed in this paper. Using the technique of unbalanced current mirror, the new BGMI circuit can achieve high charge sensitivity with adaptive current gain control and good immunity from threshold-voltage variations. Moreover, the readout dynamic range can be significantly increased by using the threshold-voltage-independent current-mode background suppression technique. To further improve the readout performance, switch current integration techniques, shared-buffer biasing technique, and dynamic charging output stage with the correlated double sampling circuit are also incorporated into the BGMI circuit. An experimental 128×128 BGMI readout chip has been designed and fabricated in 0.8 μm double-poly-double-metal (DPDM) n-well CMOS technology. The measurement results of the fabricated readout chip under 77 K and 5 V supply voltage have successfully verified both readout function and performance improvement. The fabricated chip has the maximum charge capacity of 9.5×10⁷ electrons, the transimpedance of 2.5×10⁹ Ω at 10 nA background current, and the arrive power dissipation of 40 mW. The uniformity of background suppression currents can be as high as 99%. Thus, high injection efficiency, high charge sensitivity, large dynamic range, large storage capacity, and low noise can be achieved In the BGMI circuit with the pixel size of 50×50 μm². These advantageous characteristics make the BCMI circuit suitable for various IR FPA readout applications with a wide range of background currents     

A 1.2 V 10-bit 5MS/s low power CMOS cyclic ADC based on double-sampling technique

This paper presents a 1.2 V 10-bit 5MS/s low power cyclic analog-to-digital converter (ADC). The strategy to minimize the power adopts the double-sampling technique. At the front-end, a timing-skew-insensitive double-sampled Miller-capacitance-based sample-and-hold circuit (S/H) is employed to enhance the dynamic performance of the cyclic ADC. Double sampling technique is also applied to multiplying digital-to-analog converter (MDAC). This scheme provides a better power efficiency for the proposed cyclic ADC. Furthermore, bootstrapped switch is used to achieve rail-to-rail signal swing at low-voltage power supply. The prototype ADC, fabricated in TSMC 0.18 μm CMOS 1P6 M process, achieves DNL and INL of 0.32LSB and 0.45LSB respectively, while SFDR is 69.1 dB and SNDR is 58.6 dB at an input frequency of 600 kHz. Operating at 5MS/s sampling rate under a single 1.2 V power supply, the power consumption is 1.68 mW.     

A MOS switched-capacitor instrumentation amplifier

Describes a precision switched-capacitor sampled-data instrumentation amplifier using NMOS polysilicon gate technology. It is intended for use as a sample-and-hold amplifier for low level signals in data acquisition systems. The use of double correlated sampling technique achieves high power supply rejection, low DC offset, and low 1/f noise voltage. Matched circuit components in a differential configuration minimize errors from switch channel charge injection. Very high common mode rejection (120 dB) is obtained by a new sampling technique which prevents the common mode signal from entering the amplifier. This amplifier achieves 1 mV typical input offset voltage, greater than 95 dB PSRR, 0.15 percent gain accuracy, 0.01 percent gain linearity, and an RMS input referred noise voltage of 30 /spl mu/V/input sample.     

Sub-1-V design techniques for high-linearity multistage/pipelined analog-to-digital converters

The design of an ultra-low-voltage multistage (two-stage algorithmic) analog-to-digital converter (ADC) employing the opamp-reset switching technique is described. A highly linear input sampling circuit accommodates truly low-voltage sampling from external input signal source. A radix-based digital calibration technique is used to compensate for component mismatches and reduced opamp gain under low supply voltage. The radix-based scheme is based on a half-reference multiplying digital-to-analog converter structure, where the error sources seen by both the reference and input signal paths are made identical for a given stage. The prototype ADC was fabricated in a 0.18-/spl mu/m CMOS process. The prototype integrated circuit dissipates 9 mW at 0.9-V supply with an input signal range of 0.9 V/sub p-p/ differential. The calibration of the ADC improves the signal-to-noise-plus-distortion ratio from 40 to 55 dB and the spurious-free dynamic range from 47 to 75 dB.