单轴压应变量子阱红外探测器吸收波长的研究

研究了单轴压应力对GaAs/AlGaAs/GaAs量子阱红外探测器(QWIP)吸收波长的影响。以量子阱电子干涉方法以及单轴压应力作用下量子阱应变理论为基础,分析了GaAs/AlGaAs/GaAs量子阱导带中子能级与应变的关系。理论上计算了单轴应力下四个QWIP吸收波长与应变的关系。结果表明,E1与E<1>能级之间的吸收波长和E(1)与EF能级之间的吸收波长随应变的增大而减小的幅度比E1与EF能级之间的吸收波长和E(0)与E1能级之间吸收波长随应变的增大减小的幅度大。     

GaInNAs/GaAs量子阱结构基态光跃迁的能量

从理论和实验两个方面对GaInNAs/GaAs量子阱结构基态的光跃迁能量进行研究.在理论计算过程中,分别采用电子有效质量近似法和双能级推斥模型计算了GaInNAs合金的电子空穴分立能级的能量及其带隙能,讨论了由应变引起的带隙变化量.将理论计算结果与光致发光的实验结果进行比较,两者符合得很好.并简单分析了N的加入对GaInNAs合金带隙能产生的影响.     

GaInNAs/GaAs量子阱结构基态光跃迁的能量

从理论和实验两个方面对GaInNAs/GaAs量子阱结构基态的光跃迁能量进行研究.在理论计算过程中,分别采用电子有效质量近似法和双能级推斥模型计算了GaInNAs合金的电子空穴分立能级的能量及其带隙能,讨论了由应变引起的带隙变化量.将理论计算结果与光致发光的实验结果进行比较,两者符合得很好.并简单分析了N的加入对GaInNAs合金带隙能产生的影响.     

HgCdTe的红外非线性吸收

本文系统地研究了窄禁带半导体Hg_(1-x)Cd_xTe(x=0.204)带间跃迁的动态Burstein-Moss效应。利用可调谐连续波CO_2激光的波长与100K时HgCdTe的能隙相匹配可在相当弱的光强下获得极大的非线性效应,观察到吸收系数随单色光光子能量的变化和随光强增加的吸收饱和现象,实验结果与我们的公式符合较好。     

InSb带间磁光吸收

本文介绍利用连续运行的 CO 激光器观察了 InSb 的带间磁光吸收,不同朗道能级间的跃迁形成了一系列的吸收峰值,最低的四个带间跃迁是与导带朗道能级的自旋向上(0↑)和自旋向下(0↓)以及施主杂质能级的跃迁有关。     

基于温度变化的量子阱红外探测器研究

量子阱红外探测器受到温度、压强等多种因素的影响,本文主要从温度方面进行了研究.在文献[2]的基础上,进一步推导了超晶格中热应变与温度的关系;结合量子阱红外探测器的能级公式以及波长与能级差的关系式,定量地分析了温度变化对量子阱红外探测器探测峰值波长的影响.     

P型张应变Si/SiGe量子阱红外探测器的能带设计

提出P型张应变Si/SiGe量子阱红外探测器(QWIP)结构,应用k·P方法计算应变Si/SiGe量子阱价带能带结构和应变SiGe合金空穴有效质量.结果表明量子阱中引入张应变使轻重空穴反转,基态为有效质量较小的轻空穴态,因此P型张应变Si/SiGe QWIP与n型QWIP相比具有更低的暗电流;而与P型压应变或无应变QWIP相比光吸收和载流子输运特性具有较好改善.在此基础上讨论了束缚态到准束缚态子带跃迁型张应变p-Si/SiGe QWIP的优化设计.     

GaAs/AlGaAs量子阱红外探测器的量子阱参数设计

量子阱参数如势阱宽度、势垒高度和阱中的掺杂浓度决定了阱中的能级分布及光学吸收,它和量子阱红外探测器(QWIP)的响应波长、暗电流、响应率、探测率等特性参数密切相关.为了使设计的QWIP达到预期的各种性能指标,对其各参量进行了精心设计.运用量子阱的第一激发态与势垒的高度接近时产生共振效应,进行了量子阱的优化设计,得出垒高和阱宽的关系.另外,根据器件光谱响应的要求,利用传输矩阵法计算出相应的量子阱参数.此设计方法在GaAs/AlGaAs长波-长波双色QWIP中得到了较好的验证.     

光电导归一化法测量-Si:H隙态密度

本文用光电导归一化法得出 -Si:H膜在低吸收区的光吸收系数谱;用电子从价带的指数尾态和导带边以下1.0 eV处,由悬挂键形成的局域态到导带扩展态的跃迁,解释了实验结果;并从而得出费米能级EF以下的隙态密度,通过对复合动力学的研究,还得到费米能级以上(EFn-EF)的局域态密度的平均值,从而得出费米能级以上部份的态密度。结果表明导带尾比价带尾窄。     

势垒高度对GaAs/AlxGa1-xAs QWIP光谱特性的影响

为了确定束缚态到准束缚态工作模式QWIP响应波长与势垒高度关系,采用金属有机物化学气相沉积法生长制备势垒高度不同GaAs/AlxGa1-xAs QWIP样品,采用傅里叶光谱仪对样品进行77 K液氮温度光谱测试。结果显示1#,2#样品峰值响应波长与据薛定谔方程得到峰值波长误差为15.6%,4.6%。结果表明:引起量子阱中子带间距离逐渐扩大与峰值响应波长蓝移的根本原因是势垒高度的增加。高分辨透射扫描电镜实验结果表明量子阱材料生长过程精度控制不够及AlGaAs与GaAs晶格不匹配是造成1#样品误差较大的主要原因。说明调节势垒高度可实现QWIP峰值波长微调的目的。     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.