一种具有新型增益控制技术的CMOS宽带可变增益LNA

高速超宽带无线通信的多标准融合是未来射频器件的发展趋势,该文提出一种基于CMOS工艺、具有新型增益控制技术的宽带低噪声放大器(LNA),采用并联电阻反馈实现宽带输入匹配,并引入噪声消除技术来减小噪声以提高低噪声性能;输出带有新型6位数字可编程增益控制电路以实现可变增益。采用中芯国际0.13m RF CMOS工艺流片,芯片面积为0.76 mm2。测试结果表明LNA工作频段为1.1-1.8 GHz,最大增益为21.8 dB、最小增益8.2 dB,共7种增益模式。最小噪声系数为2.7 dB,典型的IIP3为-7 dBm。     

一种5~6 GHz宽带全集成CMOS低噪声放大器

采用55 nm标准CMOS工艺,设计并流片实现了一种应用于Wi-Fi 6(5 GHz)频段的宽带全集成CMOS低噪声放大器(LNA)芯片,包括源极退化共源共栅放大器、负载Balun及增益切换单元。在该设计中,所有电感均为片上实现;采用Balun负载,实现信号的单端转差分输出;具备高低增益模式,以满足输入信号动态范围要求。测试结果表明,在高增益模式下该放大器的最大电压增益为20.2 dB,最小噪声系数为2.2 dB;在低增益模式下该放大器的最大电压增益为15 dB,最大输入1 dB压缩点为-3.2 dBm。芯片核心面积为0.28 mm²,静态功耗为10.2 mW。     

一种电流舵结构大范围连续可变增益LNA

设计了一款应用于4G(TD-LTE)的可变增益低噪声放大器(VGLNA)。输入级采用共栅极跨导增强结构,实现了电路的输入阻抗匹配,并且加入共栅极噪声抵消电路,降低了电路的噪声系数;第2级采用改进型电流舵结构,实现了电路的增益大范围连续可变;输出级采用源跟随器,实现了良好的输出阻抗匹配。基于TSMC 0.18 μm CMOS工艺,利用安捷伦射频集成电路设计工具ADS2009进行仿真验证。结果表明:在1.88~2.65 GHz频段内,该LNA在2.7~39.3 dB增益范围内连续可变,且输入端口反射系数S₁₁小于－10 dB,输出端口反射系数S₂₂小于－20 dB,最小噪声系数NF为2.6 dB,最大3阶交调点IIP3达到2.7 dBm。     

一种新型的5GHz自适应偏置及可变增益低噪声放大器

该文提出了一种新型的自适应偏置及可变增益低噪声放大器(LNA),利用电荷泵(亦称电压倍增器)将LNA输出信号转换成与LNA射频输入信号功率成比例变化的直流信号,以此信号同时反馈控制LNA的偏置和增益,来实现自适应偏置以及可变增益低噪声放大器, 从而极大地改善了LNA的输入线性范围。鉴于5GHz频率下,Bipolar相对于CMOS更好的频率特性和低噪声特性,该项研究采用了BiCMOS工艺,实现了低于3.0dB的噪声系数(高增益状态下)和大约13dBm的输入三阶交调点IIP3的控制范围以及大于15dB的增益控制范围。     

一个950MHz CMOS低噪声放大器的设计

介绍了一个采用0.18μm 1.8V RF CMOS工艺,适合GSM接收器,中心频率为950MHz的低噪声放大器(LNA)的设计过程,并给出了spectreRF的模拟结果.在935～960MHz频带内,LNA功率增益大于16dB,阻抗匹配系数S11小于-18dB,噪声系数(NF)小于2.7dB,IIP3为-3.06dBm,ldB压缩点为-10.955dBm,功耗小于20mW.     

1GHz 0.5μm CMOS低噪声放大器的设计

从低噪声放大器(LNA)的设计原理出发,提出并设计了一种工作于1GHz的实用LNA.电路采用共源-共栅的单端结构,用HSPICE软件对电路进行分析和优化.模拟过程中选用的器件采用TSMC 0.5μm CMOS工艺实现.模拟结果表明所设计的LNA功耗小于15mW,增益大于10dB,噪声系数为1.87dB,IIP3大于10dBm,输入反射小于-50dB.可用于1GHz频段无线接收机的前端.     

CMOS宽带线性可变增益低噪声放大器设计

文章设计了一种48MHz~860MHz宽带线性可变增益低噪声放大器,该放大器采用信号相加式结构电路、控制信号转换电路和电压并联负反馈技术实现。详细分析了线性增益控制、输入宽带匹配和噪声优化方法。采用TSMC0.18μm RF CMOS工艺对电路进行设计,仿真结果表明,对数增益线性变化范围为-5dB~18dB,最小噪声系数为2.9dB,S11和S22小于-10dB,输入1dB压缩点大于-14.5dBm,在1.8V电源电压下,功耗为45mW。     

基于有源电感的全集成超宽带低噪声放大器

利用有源电感来实现超宽带低噪声放大器(UWB LNA),不但可以减小芯片面积、改善增益平坦度,而且可通过外部调节偏置电压来调谐有源电感的电感值,进而调整设计中没有考虑到的由工艺变化及封装寄生带来的增益退化.采用TSMC 0.35 μm SiGe BiCMOS工艺,利用Cadence设计工具完成了放大器电路及版图的设计.在3.1～10.6 GHz工作频率范围内,通过外部调节电压来调谐有源电感,可使LNA的增益S21在16～19 dB范围内变化,输入输出回波损耗S11,S22均小于-10 dB,噪声为2.4～3.7 dB,输入3阶截点IIP3为-4 dBm.整个电路芯片面积仅为0.11 mm2.     

1.5-6GHz增益和噪声系数稳定的两级超宽带CMOS低噪声放大器设计与性能模拟

 针对UWB应用设计实现了一个1.5-6GHz的两级CMOS低噪声放大器(LNA). 通过引入共栅(CG)和共源(CS)结构以获得宽范围内的输入匹配,采用电流镜和峰化电感进行电流复用,所提出的LNA实现了非常平坦化的功率增益和噪声系数(NF). 经标准0.18μm CMOS工艺实现后,版图后模拟结果表明在1.5-5GHz频率范围内功率增益(S21)为11.45±0.05dB,在2-6GHz频率范围内噪声系数(NF)为5.15±0.05dB,输入损耗(S11)小于-18dB. 在5GHz时,模拟得到的三阶交调点(IIP3)为-7dBm,1dB压缩点为-5dBm.在1.8V电源电压下,LNA消耗6mA的电流,版图实现面积仅为0.62mm^2.     

应用于5GHz频段带ESD保护的可变增益低噪声放大器

本文给出了应用于5GHz频段的可变增益低噪声放大器。详细分析了输入寄生电容对源极电感负反馈低噪声放大器的影响,给出了一种新的ESD和LNA联合设计的方法,另外,通过在第二级中加入一个简单的反馈回路实现了增益的可变。测试结果表明： 可变增益低噪声放大器增益变化范围达25dB (-3.3dB～21.7dB),最大增益时噪声系数为2.8dB,最小增益时三阶截点为1dBm,在1.8V电源电压下功耗为9.9mW。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

GaAsSb/InAlAs PA DHBTs Grown by Production MBE

The epi material growth of GaAsSb based DHBTs with InAlAs emitters are investigated using a 4 × 100mm multi-wafer production Riber 49 MBE reactor fully equipped with real-time in-situ sensors including an absorption band edge spectroscope and an optical-based flux monitor. The state-of-the-art hole mobilities are obtained from 100nm thick carbon-doped GaAsSb. A Sb composition variation of less than ± 0.1 atomic percent across a 4 × 100mm platen configuration has been achieved. The large area InAlAs/GaAsSb/InP DHBT device demonstrates excellent DC characteristics,such as BVCEO＞6V and a DC current gain of 45 at 1kA/cm2 for an emitter size of 50μm × 50μm. The devices have a 40nm thick GaAsSb base with p-doping of 4. 5 × 1019cm-3 . Devices with an emitter size of 4μm × 30μm have a current gain variation less than 2% across the fully processed 100mm wafer. ft and fmax are over 50GHz,with a power efficiency of 50% ,which are comparable to standard power GaAs HBT results. These results demonstrate the potential application of GaAsSb/InP DHBT for power amplifiers and the feasibility of multi-wafer MBE for mass production of GaAsSb-based HBTs.     

Influence of polarization extinction ratio on distributed polarization coupling detection

Distributed polarization coupling in polarization-maintaining fibers can be detected by using a white light Michelson interferometer. This technique usually requires that only one polarization mode is excited. However, in practical measurement, the injection polarization direction could not be exactly aligned to one of the principal axes of the PMF, so the influence of the polarization extinction ratio should be considered. Based on the polarization coupling theory, the influence of the incident polarization extinction on the measurement result is evaluated and analyzed, and a method for distributed polarization coupling detection is developed when both two orthogonal eigenmodes are excited.     

Noise character analysis and the restraint of self-pulsation laser diodes

We calculate the Langevin noise sources of self-pulsation laser diodes, analyze the effects of active region noise and saturable-absorption region noise on the power fluctuation as well as period fluctuation, and propose a novel method to restrain the noise effects. A visible SIMULINK model is established to simulate the system, The results indicate that the effects of noise in absorption region can be ignored; that with the increase of DC injecting current, the noise effects enhance power jitter, and nevertheless, the period jitter is decreased; and that with external sinusoidal current modulating the self-pulsation laser diode, the noise-induced power jitter and period jitter can be suppressed greatly. This work is valuable for clock recovery in all-optical network.     

High-quality single-crystal CdSe nanoribbons and their optical properties

Large-scale synthesis of single-crystal CdSe nanoribbons is achieved by a modified thermal evaporation method, in which two-step-thermal-evaporation is used to control CdSe sources＇ evaporation. The synthesized CdSe nanoribbons are usually several micrometers in width, 50 nm in thickness, and tens to several hundred micrometers in length. Studies have shown that high-quality CdSe nanoribbons with regular shapes can be obtained by this method. Room-temperature photolumines-cence indicates that the lasing emission at 710 nm has been observed under optical pumping （266 nm） at power densities of 25-153 kW/cm^2. The full width half maximum （FWHM） of the lasing mode is 0.67 nm     

Propagation of hermite-cosh-gaussian beams passing through ABCD optical system with an annular aperture

By using the expansion of the aperture function into a finte sum of complex Gaussian functions, the corresponding analytical expressions of Hermite-cosh-Gaussian beams passing through annular apertured paraxially and symmetrically optical systems written in terms of ABCD matrix were derived, and they could reduce to the cases with squared aperture. In a similar way, the corresponding analytical expressions of cosh-Gaussian beams through annular apertured ABCD matrix were also given. The method could save more calculation time than that by using the diffraction integral formula directly.     

中国建立EB级存储实验室,致力云计算应用(英文)

正With the support of 863 programs,Sugon Information Industry Co.,Ltd.,set up a dawning EB-class storage laboratory to address massive data storage requirements and largescale cloud computing demonstration applications.The Dawning EB-class cloud storage system adopts advanced fault-tolerant architecture,efficient data fault-tolerant algorithms with user authentication and data encryption policies to deal with the"lost""wrong"and"stolen"problems of data for ensuring the reliability and safety of the EB-class storage system in the public network application environments.The Dawning EB-class Storage Laboratory taking advan-