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表面封装用无铅软钎料的接头强度及熔点范围的研究 总被引:6,自引:1,他引:5
研究了Bi的添加量,对电子表面封装(SMT)用Sn-Ag近共晶无铅软钎料钎焊接头抗拉强度和熔点及熔点范围的影响。随着Bi含量的增加,钎焊接头抗拉强度也随着增加,同时钎料的液固相线温度均降低。当Bi的含量达到5%时,抗拉强度增加快;Bi的添加量大于5%时,抗拉强度上升缓慢。在Bi的含量增加时,熔点温度范围也逐渐变宽,使得凝固时间变长,这对于表面组装中的电子元件与器件的焊接是非常不利的。故在Sn-Ag近共晶无铅软钎料中Bi的添加量,应加以适当的控制。 相似文献
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铝软钎焊时钎料元素的化学选择吸附作用 总被引:2,自引:0,他引:2
铝软钎焊的关键问题是钎焊接头耐蚀性差。本文以普通 Pb—Sn 软钎料为基体,加入能与 Al 形成界面化合物的合金元素改变钎焊接头界面电极电位和改善钎料与母材间的结合,从而提高铝软钎钎焊接头的耐蚀性。试验研究表明:加入合金元素 Ag的 Pb—Sn 钎料钎焊 Al 时,Ag 向 Al 表面的化学选择吸附作用明显,由于形成 Ag—Al 化合物使耐蚀性显著提高。本文还提出不同工艺因素对铝软钎焊接头耐蚀性影响的试验结果。 相似文献
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无铅焊及焊接点的可靠性试验 总被引:1,自引:0,他引:1
随着电子装置的小型化的发展,欧盟(EU.)的WEEE和RoHS提出禁止使用Sn-Pb焊 锡。这将导致一系列的工业革新,如部件体积和重量的减少,各种各样无铅产品的出现,改变现有 的焊接生产线等。参照国际标准(IEC,ISO)和日本国家标准(JIS),并根据这些标准做了一系列的试 验,通过试验对无铅焊润湿性、强度、耐久性等可靠性的评价方法进行说明。 相似文献
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脉冲频率及扫描方式对光纤激光软钎焊的影响 总被引:2,自引:1,他引:1
为了研究光纤激光软钎焊中激光脉冲频率和扫描方式对焊接质量的影响,通过用12 W的100%功率的SP-12P型脉冲式光纤激光扫描软钎焊系统在覆铜板上对Sn-Ag-Cu无铅钎料进行软钎焊实验,并对不同脉冲频率、不同扫描方式下的激光软钎焊技术进行实验研究.结果表明,在直线扫描方式下,高于超声波频率的500 kHz脉冲激光束作用于焊点时,会在钎料与焊盘之间的界面处发生空化作用,破碎氧化膜,使钎料在焊盘上润湿铺展,实现脉冲激光对无铅钎料Sn-Ag-Cu在覆铜板上的扫描软钎焊. 相似文献
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随着电子装置的小型化的发展,欧盟(EU.)的WEEE和RoHS提出禁止使用Sn—Pb焊锡。这将导致一系列的工业革新,如部件体积和重量的减少,各种各样无铅产品的出现,改变现有的焊接生产线等。参照国际标准(IEC,ISO)和日本国家标准(JIS),并根据这些标准做了一系列的试验,通过试验对无铅焊润湿性、强度、耐久性等可靠性的评价方法进行说明。 相似文献
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颗粒增强Sn-Ag基无铅复合钎料显微组织与性能 总被引:2,自引:0,他引:2
通过外加法向Sn-3.5Ag焊料中加入体积分数为10%的微米级Cu、Ni颗粒制备了无铅复合钎料,对钎料的显微组织、拉剪及润湿性能进行了研究。结果表明,颗粒周围以及基板界面处的显微组织中生成了金属间化合物,其形态及大小因加入颗粒而不同。颗粒的加入提高了钎料钎焊接头的剪切强度,其中Cu颗粒增强的接头的剪切强度提高了33%,Ni颗粒的提高了20%。两种复合钎料的铺展面积均下降了约15%,其中Cu颗粒增强复合钎料润湿角由11°增加到18°。 相似文献
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本文研究了一套用于SMT软钎焊接头热循环试验的热循环装置。采用SMT模拟芯片载体,在自制的热循环装置上研究了钎焊接头装置、热循环温度范围和保温时间等因素对SMT软钎焊接头热循环可靠性的影响。 相似文献
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Sn-Ag基无铅钎料Nd:YAG激光重熔界面研究 总被引:2,自引:0,他引:2
通过Nd∶YAG激光重熔和热风二次重熔试验,得到了Sn3.5Ag和Sn3.0Ag0.5Cu无铅钎料球在Cu焊盘的钎料凸台.利用扫描电子显微镜分别分析了激光重熔和热风二次重熔后两种无铅钎料与铜焊盘界面反应及组织形貌,并对激光一次重熔无铅钎料凸台进行了剪切试验,观察了凸台的剪切断口.结果表明,在合适的激光功率和加热时间条件下能够获得成形良好的无铅钎料凸台,Sn3.5Ag和Sn3.0Ag0.5Cu两种无铅钎料与Cu焊盘所产生的界面化合物主要为Cu3Sn和Cu6Sn5,凸台界面反应组织形貌以及剪切承载力与激光功率和加热时间密切相关,而且激光重熔形成的界面化合物影响热风二次重熔界面的组织形貌. 相似文献
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Development of nano-composite lead-free electronic solders 总被引:1,自引:0,他引:1
Inert, hybrid inorganic/organic, nano-structured chemicals can be incorporated into low melting metallic materials, such as
lead-free electronic solders, to achieve desired levels of service performance. The nano-structured materials technology of
polyhedral oligomeric silsesquioxanes (POSS), with appropriate organic groups, can produce suitable means to promote bonding
between nano-reinforcements and the metallic matrix. The microstructures of lead-free solder reinforced with surface-active
POSS tri-silanols were evaluated using scanning electron microscopy (SEM). Wettability of POSS-containing lead-free solders
to copper substrate was also examined. Steady-state deformation of solder joints made of eutectic Sn-Ag solder containing
varying weight fractions of POSS of different chemical moieties were evaluated at different temperatures (25°C, 100°C, and
150°C) using a rheometric solids analyzer (RSA-III). Mechanical properties such as shear stress versus simple shear-strain
relationships, peak shear stress as a function of rate of simple shear strain, and testing temperature for such nano-composite
solders are reported. The service reliability of joints made with these newly formulated nano-composite solders was evaluated
using a realistic thermomechanical fatigue (TMF) test profile. Evolution of microstructures and residual mechanical property
after different extents of TMF cycles were evaluated and compared with joints made of standard, unreinforced eutectic Sn-Ag
solder. 相似文献
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Creep Properties of Composite Solders Reinforced
with Nano- and Microsized Particles 总被引:1,自引:0,他引:1
Yaowu Shi Jianping Liu Yanfu Yan Zhidong Xia Yongping Lei Fu Guo Xiaoyan Li 《Journal of Electronic Materials》2008,37(4):507-514
In the present work the creep properties of Sn37Pb- and Sn0.7Cu-based composite solders reinforced with metallic nano- and
microsized Cu and Ag particles have been studied. First, a series of volume percentages of reinforcements were selected to
optimize the content of reinforcing particles. Then, the composite solder with optimum volume fraction of reinforcement particles,
corresponding to the maximum creep rupture lifetime, was selected to investigate the effect of applied stress and temperature
on the creep rupture lifetime of the composite solder joints. In the creep rupture lifetime test, small single-lap tensile-shear
joints were adopted. The results indicate that composite solders reinforced with microsized particles exhibit better creep
strengthening than composite solders reinforced with nanosized particles, although the mechanical tensile shear strength of
composite solder joints reinforced with nanosized particles may be higher than those reinforced with microsized particles.
Moreover, the creep strengthening action of the reinforcement particles is more obvious under conditions of lower applied
stress or lower test temperature. Strengthening by metallic Cu or Ag reinforcement particles decreases with increasing temperature
or applied stress. The Sn0.7Cu-based composite solder reinforced with microsized Ag particles is a low-cost lead-free solder
that is easy to process and may have good market potential. 相似文献
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D. Ro
ak S. Ma
ek J. Sitek M. Hrovat K. Bukat Z. Drozd 《Microelectronics Reliability》2007,47(6):986-995
The results of the influence of lead-free solder paste, design and process parameters on the attachment reliability of chip surface-mounted components (SMCs) on thick-film conductor pads are presented. The purpose of the investigation was to compare the quality of the soldered joints made with new solder pastes that do not contain lead with joints soldered with standard SnPb solders. The miniature zero-ohm chip resistors were soldered with selected lead-free solder pastes. The visual appearance of the solder joint according to the standards of lead-free soldered components was compared with components soldered with SnPb solders. On the test sample with soldered chip resistors connected in series, the solder-joint resistance was measured before and after temperature cycling. On the same test sample the solder-joint resistance changes were measured with impedance spectroscopy. After temperature cycling the damaged samples were analysed with SEM and EDS. The reliability test results after temperature cycling indicate two lead-free solder pastes that are the most convenient for chip-component soldering on thick-film conductor pads with the reliability of the joints being equal or better than solder joints with Pb-containing solder paste. 相似文献
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Masazumi Amagai Masako Watanabe Masaki Omiya Kikuo Kishimoto Toshikazu Shibuya 《Microelectronics Reliability》2002,42(6):951-966
Recently, preventing environmental pollutions, lead-free (Pb-free) solders are about to replace tin–lead (Sn–Pb) eutectic solders. However, the mechanical properties of Pb-free solders have not been clarified. Hence, the following study was conducted; first, a rate-dependent plasticity was characterized to represent the inelastic deformation behavior for Sn–Ag-based lead-free solders. The material parameters in a constitutive model were determined in a direct method combining both rate-dependent and rate-independent plastic strains. The constitutive model unifies both rate-dependent creep behavior and rate-independent plastic behavior occurring concurrently at the same time in the solders. Secondly, the strength of solders with a variety of plating materials was studied. Intermetallic compounds (IMC) between solder and electrical pads are formed during reflow process and gradually grow in service. By using the Cu-plates on which Cu or Ni or Ni/Au plating was deposited, the specimens of solder joints were fabricated with Sn–Ag-based lead-free solders. After aging the specimens in an isothermal chamber, tensile tests were performed. From scanning electron microscope (SEM) microscope observation and EDX microprobe analysis, the growth and components of the IMC layer were also examined. Based on the experimental tests, the relations between solder joint strength and the aging period were discussed. Furthermore, the validation of fracture strength of solder joints resulting from the tensile tests was verified with package-mounted board level reliability tests. 相似文献
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J. C. Foley A. Gickler F. H. Leprevost D. Brown 《Journal of Electronic Materials》2000,29(10):1258-1263
The drive to replace the use of toxic lead metal and its alloys has spurred the development of many new lead-free solder alloys.
Moreover, current leaded solders lack shear strength, resistance to creep and to thermal-mechanical fatigue. Solder that exhibits
enhancements of these properties and retains solderability is crucial in applications where the solder joints are subjected
to thermal cycling, severe vibrations, and temperatures of up to 125°C. Modified ring and plug joints were made with 18 selected
lead-free solders and three well characterized lead-containing solders. Analysis of the results provides a guide for the design
of additional testing. 相似文献
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The reliability of electronics under drop-shock conditions has attracted significant interest in recent years due to the widespread use of mobile electronic products. This review focuses on the drop-impact reliability of lead-free solder joints that interconnect the integrated circuit (IC) component to the printed circuit board (PCB). Major topics covered are the physics of failure in drop-impact; the use of board level and component level test methods to evaluate drop performance; micro-damage mechanisms; failure models for life prediction under drop-impact; modelling and simulation techniques; and dynamic stress–strain properties of solder joint materials. Differential bending between the PCB and the IC component is the dominant failure driver for solder joints in portable electronics subjected to drop-impact. Board level drop-shock tests correlate well with board level high speed cyclic bending tests but not with component level ball impact shear tests. Fatigue is the micro-damage mechanism responsible for the failure of solder joints in the drop-shock of PCB assemblies and the fatigue strength of solder joints depends strongly on the strain rate, test temperature, and the sequence of loading. Finally, tin-rich lead-free solders exhibit significantly higher strain rate sensitivity than eutectic SnPb solder. 相似文献
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As the electronics industry is moving towards lead-free manufacturing processes, more effort has been put into the reliability study of lead-free solder materials. Various tin–silver–copper-based solders have become widely accepted alternatives for tin–lead solders. In this study, we have tested three different SnAgCu solder compositions. The first consisted of a hypoeutectic 96.5Sn/3.0Ag/0.5Cu solder, the second of a eutectic 95.5Sn/3.8Ag/0.7Cu solder, and the third of a hypereutectic 95.5Sn/4.0Ag/0.5Cu solder. A eutectic SnPb solder was used as a reference. The test boards were temperature-cycled (−40 to +125 °C) until all samples failed. The results of the temperature cycling test were analyzed, and cross-section samples were made of the failed joints. Scanning electron and optical microscopy were employed to analyze the fracture behavior and microstructures of the solder joints. The reliability of lead-free solders and the effect of microstructures on joint reliability are discussed. 相似文献