一种连续输出的小失调开关电容带隙基准源

An improved switched-capacitor bandgap reference with a continuous output voltage of 1.26 V has been implemented with Chartered 0.35-μm 5-V CMOS process. The output offset voltage, induced by non-ideal characteristics of operational amplifier and bias current generator, is suppressed by the proposed sample-and-hold circuit and self-bias technique. Experimental results show that the proposed circuit operates properly under a supply voltage varying from 3 to 5 V. The measured temperature coefficient is 112 ppm/℃ and the power supply rejection ratio of output voltage without any filtering capacitor is -40 dB and -33 dB at 100 Hz and 10 MHz, respectively.     

New Curvature-Compensated CMOS Bandgap Voltage Reference

A novel curvature-compensated CMOS bandgap voltage reference is presented. The reference utilizes two first order temperature compensations generated from the nonlinearity of the finite current gain β of vertical pnp bipolar transistor. The proposed circuit, designed in a standard 0.18 μm CMOS process, achieves a good temperature coefficient of 2.44 ppm/℃ with temperature range from --40℃ to 85 ℃, and about 4 mV supply voltage variation in the range from 1.4 V to 2.4 V. With a 1.8 V supply voltage, the power supply rejection ratio is -56dB at 10MHz.     

A New CMOS Current Reference with High Order Temperature Compensation

A new high order CMOS temperature compensated current reference is proposed in this paper, which is accomplished by two first order temperature compensation current references. The novel circuit exploits the temperature characteristics of integrated-circuit resistors and gate-source voltage of MOS transistors working in weak inversion. The proposed circuit, designed with a 0.6 Izm standard CMOS technology, gives a good temperature coefficient of 31ppm/℃ [-50-100℃] at a 1.8V supply, and also achieves line regulation of 0.01%/V and-120dB PSR at 1 MHz. Comparing with other presented work, the proposed circuit shows better temperature coefficient and Line regulation.     

A sub-1 V high-precision CMOS bandgap voltage reference

A third-order, sub-1 V bandgap voltage reference design for low-power supply, high-precision applications is presented. This design uses a current-mode compensation technique and temperature-dependent resistor ratio to obtain high-order curvature compensation. The circuit was designed and fabricated by SMIC 0.18 μm CMOS technology. It produces an output reference of 713.6 mV. The temperature coefficient is 3.235 ppm/℃ in the temperature range of -40 to 120 ℃, with a line regulation of 0.199 mV/V when the supply voltage varies from 0.95 to 3 V. The average current consumption of the whole circuit is 49 μA at the supply voltage of 1 V.     

An inherent curvature-compensated voltage reference using non-linearity of gate coupling coefficient

A novel current-mode voltage reference circuit which is capable of generating sub-1 V output voltage is presented. The proposed architecture exhibits the inherent curvature compensation ability. The curvature compensation is achieved by utilizing the non-linear behavior of gate coupling coefficient to compensate non-linear temperature dependence of base-emitter voltage. We have also utilized the developments in CMOS process to reduce power and area consumption. The proposed voltage reference is analyzed theoretically and compared with other existing methods. The circuit is designed and simulated in 180 nm mixed-mode CMOS UMC technology which gives a reference level of 246 mV. The minimum required supply voltage is 1 V with maximum current drawn of 9.24 μA. A temperature coefficient of 9 ppm/℃ is achieved over -25 to 125 ℃ temperature range. The reference voltage varies by ±11 mV across process corners. The reference circuit shows the line sensitivity of 0.9 mV/V with area consumption of 100 × 110 μm².     

A 140 mV 0.8μA CMOS voltage reference based on sub-threshold MOSFETs

A CMOS voltage reference circuit based on sub-threshold MOSFETs is proposed,which utilizes a temperature-dependent threshold voltage,a peaking current mirror and sub-threshold technology.The reference has been fabricated in an SMIC 0.13μm CMOS process with only MOS transistors and resistors.The experimental results show a reference voltage variation of 2 mV for a supply voltage ranging from 0.5 to 1.2 V and 0.8 mV for temperatures from -20 to 120℃.The proposed circuit generates a reference voltage of 140 mV and consumes a supply current of 0.8μA at room temperature.The occupied area is only 0.019 mm~2.     

A low-voltage low-power CMOS voltage reference based on subthreshold MOSFETs

This paper describes a CMOS voltage reference using only resistors and transistors working in weak inversion,without the need for any bipolar transistors.The voltage reference is designed and fabricated by a 0.18μm CMOS process.The experimental results show that the proposed voltage reference has a temperature coefficient of 370 ppm/℃at a 0.8 V supply voltage over the temperature range of-35 to 85℃and a 0.1%variation in supply voltage from 0.8 to 3 V.Furthermore,the supply current is only 1.5μA at 0.8 V supply voltage.     

多管组合曲率补偿低压带隙基准源

A new bandgap reference(BGR) curvature compensation technology is proposed,which is a kind of multiple transistor combination.On the basis of the existing first-order bandgap reference technology,a compensation current circuit consisting of a sink current branch and a source current branch is added.The BGR was designed and simulated by using Semiconductor Manufacturing International Corporation(SMIC) 0.18μm CMOS process.The simulation results showed that when the power supply voltage was 1 V,the temperature coefficient of the BGR was 2.08 ppm/℃with the temperature range from—40 to 125℃,the power supply rejection ratio (PSRR) was—64.77 dB and the linear regulation was 0.44 mV/V with the supply power changing from 0.85 to 1.8 V.     

一种1.8伏带有foldback过流过热保护的低压线性稳压器设计

This paper introduces the design of a l.8 V low dropout voltage regulator （LDO） and a foldback current limit circuit which limits the output current to 3 mA when load over-current occurs. The LDO was implemented in a 0.18 μm CMOS technology. The measured result reveals that the LDO s power supply rejection （PSR） is about -58dB and -54dB at 20Hz and 1kHz respectively,the response time is 4μs and the quiescent currentis 20μA. The designed LDO regulator can work with a supply voltage down to 2.0 V with a drop-out voltage of 200 mV at a maximum load current of 240 mA.     

A process/temperature variation tolerant RSSI

A low power process/temperature variation tolerant CMOS received signal strength indicator (RSSI) and limiter amplifier are designed using SMIC 0.13μm CMOS technology. The limiter uses six-stage amplifier architecture for minimum power consideration. The RSSI has a dynamic range more than 60dB, and the RSSI linearity error is within ±0.5dB for an input power from -65dBm to -8dBm. The RSSI output voltage is from 0.15V to 1V and the slope of the curve is 14.17mV/dB. Furthermore, with the compensation circuit, the proposed RSSI shows good temperature-independent and good robustness against process variation characteristics. The RSSI with integrated AGC loop draws 1.5mA (I and Q paths) from a 1.2V single supply.     

一种新型指数增益控制60dB可变增益放大器

A CMOS variable gain amplifier（VGA） that adopts a novel exponential gain approximation is presented.No additional exponential gain control circuit is required in the proposed VGA used in a direct conversion receiver.A wide gain control voltage from 0.4 to 1.8 V and a high linearity performance are achieved.The three-stage VGA with automatic gain control（AGC） and DC offset cancellation（DCOC） is fabricated in a 0.18-μm CMOS technology and shows a linear gain range of more than 58-dB with a linearity error less than ±1 dB.The 3-dB bandwidth is over 8 MHz at all gain settings.The measured input-referred third intercept point（IIP3） of the proposed VGA varies from-18.1 to 13.5 dBm,and the measured noise figure varies from 27 to 65 dB at a frequency of 1 MHz.The dynamic range of the closed-loop AGC exceeds 56 dB,where the output signal-to-noise-and-distortion ratio（SNDR） reaches 20 dB.The whole circuit,occupying 0.3 mm^2 of chip area,dissipates less than 3.7 mA from a 1.8-V supply.     

闭环曲率补偿的低电源电压带隙基准源

A new low-voltage CMOS bandgap reference （BGR） that achieves high temperature stability is proposed. It feeds back the output voltage to the curvature compensation circuit that constitutes a closed loop circuit to cancel the logarithmic term of voltage VBE. Meanwhile a low voltage amplifier with the 0.5 μm low threshold technology is designed for the BGR. A high temperature stability BGR circuit is fabricated in the CSMC 0.5μm CMOS technology. The measured result shows that the BGR can operate down to 1 V, while the temperature coefficient and line regulation are only 9 ppm/℃ and 1.2 mV/V, respectively.     

基于带隙的具有高稳定性欠压锁存方法

Highly reliable bandgap-based under-voltage-lockout(UVLO) methods are presented in this paper.The proposed under-voltage state to signal conversion methods take full advantages of the high temperature stability characteristics and the enhancement low-voltage protection methods which protect the core circuit from error operation; moreover,a common-source stage amplifier method is introduced to expand the output voltage range.All of these methods are verified in a UVLO circuit fabricated with a 0.5 μm standard BCD process technology.The experimental result shows that the proposed bandgap method exhibits a good temperature coefficient of 20 ppm/℃,which ensures that the UVLO keeps a stable output until the under-voltage state changes.Moreover,at room temperature,the high threshold voltage VTH+ generated by the UVLO is 12.3 V with maximum drift voltage of 80 mV,and the low threshold voltage VTH- is 9.5 V with maximum drift voltage of ±70 mV.Also,the low voltage protection method used in the circuit brings a high reliability when the supply voltage is very low.     

A CMOS low power, process/temperature variation tolerant RSSI with an integrated AGC loop

A low voltage low power CMOS limiter and received signal strength indicator(RSSI) with an integrated automatic gain control(AGC) loop for a short-distance receiver are implemented in SMIC 0.13μm CMOS technology.The RSSI has a dynamic range of more than 60 dB and the RSSI linearity error is within i0.5 dB for an input power from -65 to -8 dBm.The RSSI output voltage is from 0.15 to 1 V and the slope of the curve is 14.17 mV/dB while consuming 1.5 mA(I and Q paths) from a 1.2 V supply.Auto LNA gain mode selection with a combined RSSI function is also presented.Furthermore,with the compensation circuit,the proposed RSSI shows good temperature-independent and good robustness against process variation characteristics.     

Design and realization of an ultra-low-power low-phase-noise CMOS LC-VCO

A fully integrated cross-coupled LC tank voltage-controlled oscillator(LC-VCO) using transformer feedback is proposed to achieve a low phase noise and ultra-low-power design even at a supply below the threshold voltage. The ultra-low-power VCO is implemented in the mixed-signal and RF 1P6M 0.18-μm CMOS technology of SMIC. The measured phase noise is-125.3 dBc/Hz at an offset frequency of 1 MHz from a carrier of 2.433 GHz,while the VCO core circuit draws only 640μW from a 0.4-V supply.The designed VCO can...     

一个具有温度补偿特性的无电阻CMOS电流基准源

A resistorless CMOS current reference is presented.Temperature compensation is achieved by subtracting two sub-currents with different positive temperature coefficients.The circuit has been implemented with a Chartered0.35μm CMOS process.The output current is 1.5μA,and the circuit works properly with a supply voltage down to 2 V.Measurement results show that the temperature coefficient is 98 ppm/℃,and the line regulation is 0.45%/V.The occupied chip area is 0.065 mm~2.     

A resistorless CMOS current reference with temperature compensation

A resistorless CMOS current reference is presented.Temperature compensation is achieved by subtracting two sub-currents with different positive temperature coefficients.The circuit has been implemented with a Chartered0.35μm CMOS process.The output current is 1.5μA,and the circuit works properly with a supply voltage down to 2 V.Measurement results show that the temperature coefficient is 98 ppm/℃,and the line regulation is 0.45%/V.The occupied chip area is 0.065 mm~2.     

一种用于数字电视调谐器的宽带CMOS无电感噪声抵消低噪声放大器

A wideband inductorless low noise amplifier for digital TV tuner applications is presented. The proposed LNA scheme uses a composite NMOS/PMOS cross-coupled transistor pair to provide partial cancellation of noise generated by the input transistors. The chip is implemented in SMIC 0.18 μm CMOS technology. Measurement shows that the proposed LNA achieves 12.2-15.2 dB voltage gain from 300 to 900 MHz, the noise figure is below 3.1 dB and has a minimum value of 2.3 dB, and the best input-referred 1-dB compression point(IP1dB) is - 17 dBm at 900 MHz. The core consumes 7 mA current with a supply voltage of 1.8 V and occupies an area of 0.5×0.35 mm2.     

一种光接收机中的高增益宽动态范围跨阻放大器

As the front-end preamplifiers in optical receivers, transimpedance amplifiers （TIAs） are commonly required to have a high gain and low input noise to amplify the weak and susceptible input signal. At the same time, the TIAs should possess a wide dynamic range （DR） to prevent the circuit from becoming saturated by high input currents. Based on the above, this paper presents a CMOS transimpedance amplifier with high gain and a wide DR for 2.5 Gbit/s communications. The TIA proposed consists of a three-stage cascade pull push inverter, an automatic gain control circuit, and a shunt transistor controlled by the resistive divider. The inductive-series peaking technique is used to further extend the bandwidth. The TIA proposed displays a maximum transimpedance gain of 88.3 dBΩ with the -3 dB bandwidth of 1.8 GHz, exhibits an input current dynamic range from 100 nA to 10 mA. The output voltage noise is less than 48.23 nV/√Hz within the -3 dB bandwidth. The circuit is fabricated using an SMIC 0.18 μm 1P6M RFCMOS process and dissipates a dc power of 9.4 mW with 1.8 V supply voltage.     

一种新型的物理不可克隆函数体系结构

This paper describes a new silicon physical unclonable function(PUF) architecture that can be fabricated on a standard CMOS process. Our proposed architecture is built using process sensors, difference amplifier,comparator, voting mechanism and diffusion algorithm circuit. Multiple identical process sensors are fabricated on the same chip. Due to manufacturing process variations, each sensor produces slightly different physical characteristic values that can be compared in order to create a digital identification for the chip. The diffusion algorithm circuit ensures further that the PUF based on the proposed architecture is able to effectively identify a population of ICs. We also improve the stability of PUF design with respect to temporary environmental variations like temperature and supply voltage with the introduction of difference amplifier and voting mechanism. The PUF built on the proposed architecture is fabricated in 0.18 m CMOS technology. Experimental results show that the PUF has a good output statistical characteristic of uniform distribution and a high stability of 98.1% with respect to temperature variation from –40 to 100C, and supply voltage variation from 1.7 to 1.9 V.