基于V93000的SoC中端口非测试复用的ADC和DAC IP核性能测试方案

 SoC(System-on-a-Chip)芯片设计中,由于芯片测试引脚数目的限制以及基于芯片性能的考虑,通常有一些端口不能进行测试复用的IP(Intellectual Property)核将不可避免地被集成在SoC芯片当中.对于端口非测试复用IP核,由于其端口不能被直接连接到ATE(Automatic Test Equipment)设备的测试通道上,由此,对端口非测试复用IP核的测试将是对SoC芯片进行测试的一个重要挑战.在本文当中,我们分别提出了一种基于V93000测试仪对端口非测试复用ADC(Analog-to-Digital Converter)以及DAC(Digital-to-Analog Converter)IP核的性能参数测试方法.对于端口非测试复用ADC和DAC IP核,首先分别为他们开发测试程序并利用V93000通过SoC芯片的EMIF(External Memory Interface)总线对其进行配置.在对ADC和DAC IP 核进行配置以后,就可以通过V93000捕获ADC IP 核采样得到的数字代码以及通过V93000 采样DAC IP 核转换得到的模拟电压值,并由此计算ADC以及DAC IP 核的性能参数.实验结果表明,本文分别提出的针对端口非测试复用ADC以及DAC IP 核测试方案非常有效.     

基于IEEE Std1500标准的互连检测构架设计

摘要：随着电路系统向着高密度、高速度的方向发展,引发了严重的信号完整性问题。针对串扰故障,MT故障检测模型具有较好的故障覆盖率,但也存在含有大量矢量冗余的问题。通过对传统MT故障模型的精简,提出了一种新的串扰故障检测模型—改进型MT模型。模型对种子进行筛选及施加,测试矢量有规律跳变,产生了全部的测试矢量。通过对基于IEEE Std 1500标准的IP核测试壳各部分进行设计,特别是对测试环单元进行设计,实现了改进型MT模型故障检测。设计的IP核测试壳能够对IP核与核间互连线进行串行测试和并行测试。通过quartus ii平台仿真及数据计算,验证了该测试构架的有效性和故障检测的高效性。     

基于FPGA的UPFC控制器IP设计

统一潮流控制器(UPFC)是柔性交流输电系统(FACTS)的一种,其核心是控制系统设计.文中根据正弦脉宽调制原理,并针对软件和硬件实现正弦调制波形所存在的不同缺点,提出了一种采用固件IP核来实现正弦调制波形的方法,详细介绍了统一潮流控制器IP核的功能及其结构,给出了通过一片FPGA芯片来实现该调制的方法以及IP核的功能仿真图.     

FPGA中嵌入式块存储器的IP软核设计

以集成电路的快速发展与广泛应用为契机,针对FPGA开发过程中IP软核可复用的特点,提出一种提升FPGA嵌入式块存储器工作频率的IP软核设计方法。利用软件对不同读写类型和不同输入位宽的数据进行预处理,获取所需的硬件资源开销,并生成相应的硬件描述语言。IP软核设计时,在使用固定硬件资源的情况下,通过优化数据预处理方法,以及改变在综合阶段布局布线的处理结果,提高了工作频率。对设计的IP软核进行测试验证,结果表明,该设计方法生成的IP软核的功能和性能指标均符合设计要求,其工作频率最高可提升25.56%。     

一种10位200 kS/s 65 nm CMOS SAR ADC IP核

该文基于65 nm CMOS低漏电工艺,设计了一种用于触摸屏SoC的8通道10位200 kS/s逐次逼近寄存器型(Successive Approximation Register,SAR) A/D转换器(Analog-to-Digital Converter,ADC) IP核。在D/A转换电路的设计上,采用7MSB (Most-Significant-Bit) + 3LSB (Least-Significant-Bit) R-C混合D/A转换方式,有效减小了IP核的面积,并通过采用高位电阻梯复用技术有效减小了系统对电容的匹配性要求。在比较器的设计上,通过采用一种低失调伪差分比较技术,有效降低了输入失调电压。在版图设计上,结合电容阵列对称布局以及电阻梯伪电阻包围的版图设计方法进行设计以提高匹配性能。整个IP核的面积为322m267m。在2.5 V模拟电压以及1.2 V数字电压下,当采样频率为200 kS/s,输入频率为1.03 kHz时,测得的无杂散动态范围(Spurious-Free Dynamic Range,SFDR)和有效位数(Effective Number Of Bits,ENOB)分别为68.2 dB和9.27,功耗仅为440W,测试结果表明本文ADC IP核非常适合嵌入式系统的应用。     

基于安全控制边界单元的IP核测试封装方法

为了解决测试信息传递的问题,IEEE组织推出了IEEE1500 IP(Intellectual Property)核测试封装标准以标准化口核测试接口.然而该标准给出的典型测试封装存在由测试数据扫描移人造成的不安全隐患.本文提出了一种基于安全控制边界单元的IP核测试封装方法.这种方法的核心思想是在典型的测试封装边界单元的...     

复用NoC测试IP芯核测试存取链优化配置

论述了层次型IP芯核不同测试模式之间的约束关系,给出了层次型IP芯核的测试壳结构,提出了一种复用片上网络测试内嵌IP芯核的启发式测试存取链优化配置方法.该方法可有效减小测试数据分组数量和被测芯核的测试时间.使用片上网络测试平台,在测试基准电路集ITC'02中的基准电路p22810上进行了实验验证.     

IP网络的快速故障恢复

 随着互联网的迅速发展,人类通信对其依赖性日益增强,而IP层故障恢复能力低下,阻碍了互联网性能的提高.近些年来,国际学术界对IP网络快速故障恢复的方案研究异常活跃,提出了加快故障恢复速度的三条途径:(1)加快IP路由收敛;(2)使用主动式故障恢复;(3)提高故障检测的速度与准确性.针对已有解决方案的不足,本文得出,要推动IP网络的快速故障恢复方案的实现,必须做好:(1)故障后的通信负载均衡;(2)互操作测试及路由器体系结构的重新设计.     

一种实现数模混合电路中ADC测试的BIST结构

针对模／数转换器(ADC)数模混合电路的测试问题，提出了一种内建自测试(BIST)的测试结构，分析并给出了如何利用该结构计算ADC的静态参数和信噪比参数。利用该方法，既可以利用柱状图快速测试ADC的静态参数，又可利用FFT技术实现对ADC频域参数的分析，使得测试电路简单、紧凑和有效。     

改进MT模型的互连线串扰故障检测

针对片上系统IP核间互连线串扰故障的检测问题,提出了一种新的激励检测模型-改进型M T 模型。改进型MT模型建立在传统的MT串扰故障检测模型基础上,对MT模型存在的大量矢量冗余进行精简。该模型通过对种子的筛选及施加,在改进的边界扫描单元构架上产生全部的测试矢量。改进型M T模型在保证100％故障覆盖率的前提下,通过软件仿真及数据比较,验证了改进型MT模型的可行性及高效性。     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.