基于共模电平偏移电路新型CMOS低电压满幅度运放设计

针对电源电压为1V甚至更低的应用环境,给出了一种基于共模电平偏移电路的新型rail-to-rail运放结构,相对以往同类电路具有很好的对称性和较高的输入阻抗,并对之进行了详细的讨论.在整个共模输入电压范围内,其单位增益带宽随共模电压变化仅为0.05%.     

一种30 dB增益范围的CMOS可变增益放大器

采用0.25μm CMOS工艺设计了一种增益动态范围为30dB的可变增益放大器.该可变增益放大器以Gilbert单元为主体电路,在此基础上采用共源共栅结构,以及电流-电压负反馈的形式,极大地提高了电路的放大增益,并采用共模反馈回路,稳定了高阻输出节点的共模电压,还加入了指数控制电路,使增益与控制电压成dB-线性变化.电源工作电压3.3 V,电路功耗15 mW.     

一种高共模抑制比仪用放大电路的设计

本文针对传统仪用放大电路的特点,介绍了一种高共模抑制比仪用放大电路, 通过提取共模输入电压,引入共模负反馈,大大提高了通用仪表放大器的共模抑制能力。     

应用于中枢神经信号重建系统的跨导放大器

设计并实现了一种应用于中枢神经信号重建系统中的跨导放大器.采用前馈结构,有效地减小了输入失调电压,并提高了对共模信号的抑制能力,且电压输入范围允许自正电源电压至负电源电压.输出电流最高可达1mA.电路采用0.6μm CMOS工艺制造,面积0.6mm2.测试得到的电路跨导为0.38mS,输入失调电压为0.57mV,共模抑制比为-54dB,可满足中枢神经信号重建系统的要求.     

高性能折叠式共源共栅运算放大器的设计

折叠式共源共栅结构能够提供足够高的增益,并且能够增大带宽、提高共模抑制比和电源电压抑制比.基于Chartered 0.35 μm工艺,设计了一种折叠式共源共栅结构的差分输入运算放大器,给出了整个电路结构.Spectre仿真结果表明,该电路在3.3V电源电压下直流开环增益为121.5dB、单位增益带宽为12 MHz、相位裕度为61.4°、共模抑制比为130.1dB、电源电压抑制比为105 dB,达到了预期的设计目标.     

基于前馈gmf的共模反馈稳定性增强电路

基于0.13 μm CMOS工艺,提出并设计了一种应用于三级全差分运算放大器中的新型共模反馈电路。将具有密勒补偿结构的典型两级全差分结构和源随器结构作为三级运算放大器的放大级,通过在共模反馈电路中引入前馈通路,产生的两个零点提高运放的稳定性,解决了传统共模反馈电路中多个极点难以补偿的问题。仿真结果表明,在1.2 V电源电压下,共模下增益为70.4 dB,单位增益带宽为56 MHz,相位裕度为85.5°。相比于传统无前馈电路,新型共模反馈电路的单位增益带宽和相位裕度分别提高了8.2 MHz和17.4°。具有这种共模反馈结构的运算放大器可以实现较低的电源电压和较好的相位裕度。     

一种高速LVDS驱动电路的设计

介绍了一种采用0.18μm CMOS工艺制作的高速(500MHz)LVDS驱动电路.分析了开关时序和共模反馈对电路的影响,采用开关控制信号整形电路和基于"主-从"结构的共模设置电路,得到适当的开关时序和较好的共模电平设置,使LVDS输出电路具有更小的过冲电压和更稳定的共模电平.该LVDS驱动电路用于1GHz 14位高速D/A转换器芯片.样品电路测试结果表明,输出速率在500MHz时,LVDS驱动电路的指标满足IEEE-1596 reduced range link标准.     

应用于subLVDS接口的1.5Gb/s收发器设计

介绍了subLVDS接口的系统结构并给出一种改进的内部收发器实现电路.为了稳定直流工作点,在发送器内部加入与电源电压无关的自偏置电压源和共模负反馈电路;通过轨到轨预放大器,接收器的共模输入电压可以达到电源至地的范围.SMIC0.18μm 1P6M的工艺下,仿真结果表明该系统对随机输入数据的工作速度可以达到1.5Gb/s,工作温度范围为-40～120℃.     

适用于全差分运算放大器的两级共模反馈结构

针对两级全差分运算放大器对输入级和输出级不同的性能要求,设计了连续时间共模反馈电路和开关电容共模反馈电路,使运放在稳定电路直流工作点的同时提高输出摆幅.基于0.13μm CMOS混合信号工艺对电路进行仿真,结果表明,该运放两级共模反馈瞬态输出的波动范围分别为1.06 mV和2.21 mV,在2.5 V电源电压下具有91.6 dB直流开环增益,负载电容为1.5 pF 时单位增益带宽为1.163 GHz.     

用于HBWLED驱动电路的宽共模电压误差放大器

针对高亮度白光(HBW)LED驱动芯片等在高输入共模电压条件下工作的应用需要,提出一种基于高端电流检测的新型误差放大器,其特点是共模电压范围宽,具有良好的高端电流检测特性.特殊的电路结构设计使该放大器具有失调电压可调的功能,可用于实现对LED调光电流的控制.给出了整个电路的设计,并在1.5 μm BiCMOS工艺下实现.仿真结果显示,误差放大器输入共模范围达350 V,共模抑制比为80 dB,输入失调电压可调范围为8～92 mV.测试结果表明,芯片的主要性能与设计结果相符.     

Technology innovation and process integrations for sub-100nm gate patterning

This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration.     

White organic light-emitting devices based on fac tris（2- phenylpyridine） iridium sensitized 5,6,11,12-tetraphenylnap -hthacene

We have fabricated the white organic light-emitting devices （WOLEDs） based on 4,4＇ -bis（2,2 -diphenyl vinyl）-1,1＇ - biphenyl （DPVBi） and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene （rubrene）. The device structure is ITO/2T-NATA （20 nm）/NPBX （20 nm）/CBP： x%Ir（ppy）3：0.5% rubrene （8 nm）/NPBX （5 nm）/DPVBi （30 nm）/Alq（30 nm）/LiF（0.5 nm）/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris （2-phenylpyridine） iridium [Ir（ppy）3], acts as a yellow light-emitting layer, and N,N＇ -bis- （1-naphthyl）- N,N＇ -diphenyl -1, 1＇ -biphenyl-4,4＇ -diamine （NPBX） acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir （PPY）3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V.     

Complete approach to automatic identification and subpixel center location for ellipse feature

To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction.     

小角度扩展相关性近似算法分析

本论文提出一种在多天线MIMO信道相关性建模中小角度扩展近似理论算法,并应用于分析MIMO系统性能。分析中分别对三种不同角能量分布情况下的空间相关性研发快速近似计算法,并同时提出双模(Bi-Modal)角能量分布情况下的近似运算。通过分析这些新方法的近似效率,可以得到计算简单、复杂度低、而且符合实际的MIMO相关信道矩阵,对系统级的快速高效计算法的研究和系统级的评估以及误差分析具有重要的意义。     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

A Versatile Mixed-Signal Pin Approach for Cost-Effective Test of Automotive ICs

Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

Critical Stage Rule-Based Real Time Dispatch（RTD）System in Highly-Mixed-Products （HMP） FAB

An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB.     

Optical vibration and deviation measurement of rotating machine parts

It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer （LDV）.