混合模块TC~2CLA无等待时间序列及性质

在不增加顶层进位级联超前进位加法器(TC2CLA)模块延迟时间的条件下,为最大限度地扩展操作位数,在分析混合模块TC2CLA的延迟时间公式的基础上提出了混合模块顶层级联超前进位加法器无等待时间序列.给出了混合模块TC2CLA无等待时间序列和无等待时间完全序列的定义,推证出序列的延迟时间公式及一系列重要性质.     

超前进位加法器混合模块延迟公式及优化序列

为扩展操作位数提出了一种更具普遍性的长加法器结构——混合模块级联超前进位加法器。在超前进位加法器(CLA)单元电路优化和门电路标准延迟模型的基础上，由进位关键路径推导出混合模块级联CLA的模块延迟时间公式，阐明了公式中各项的意义。作为特例，自然地导出了相同模块级联CLA的模块延迟时间公式。并得出和证明了按模块层数递增级联序列是混合模块级联CLA各序列中延迟时间最短、资源(面积)占用与功耗不变的速度优化序列。这一结论成为优化设计的一个设计规则。还给出了级联序列数的公式和应用实例。     

混合模块TC~2CLA优化设计的结构参数约束

在顶层进位级联超前进位加法器（TC2 CLA）基本单元及组合方案优化设计的基础上,将微电子技术工艺水平制约下的门电路最大扇入数Nfanin（max）和扇出数Nfanout（max）经分析、归纳转化为混合模块TC2 CLA全面优化设计的结构参数约束.推导出TC2 CLA结构参数组位数jm,模块层数Mj与Nfanin（max）、Nfanout（max）的约束公式,并列出优化分析表.公式和优化表给出了TC2 CLA结构参数（jm、Mj）在全面优化设计中的约束,为混合模块TC2 CLA及优化序列、无等待时间序列的优化设计及操作位的扩展奠定了基础.     

混合模块无等待时间序列超前进位加法器设计

在不增加超前进位加法器模块延迟时间的条件下,为最大限度地扩展操作位数,在分析混合模块超前进位加法器(CLA)延迟时间公式的基础上提出了混合模块无等待时间序列超前进位加法器.给出了混合模块CLA的无等待时间序列和无等待时间完全序列的定义,推证出序列的延迟时间公式及重要性质.并在功耗、面积(资源)占用约束下,优化设计了操作位数复盖范围为10～854位的94个混合模块无等待时间序列超前进位加法器.实现了保持CLA模块速度条件下,最大限度地扩展操作位数的目的.     

基于逻辑结构的超前进位加法器的设计

通过对计算机加法器的研究,从门电路标准延迟模型出发,在对超前进位加法器逻辑公式研究的基础上,在主要考虑速度的前提下,给出了超前进位加法器的逻辑电路的设计方案。主要对16位、32位加法器的逻辑电路进行分析设计,通过计算加法器的延迟时间来对比超前进位加法器与传统串行进位链加法器,得出超前进位算法在实际电路中使加法器的运算速度达到最优。     

对数跳跃加法器的算法及结构设计

本文介绍一种新型加法器结构——对数跳跃加法器,该结构结合进位跳跃加法器和树形超前进位加法器算法,将跳跃进位分组内的进位链改成二叉树形超前进位结构,组内的路径延迟同操作数长度呈对数关系,因而结合了传统进位跳跃结构面积小、功耗低的特点和ELM树形CLA在速度方面的优势.在结构设计中应用Ling's算法设计进位结合结构,在不增加关键路径延迟的前提下,将初始进位嵌入到进位链.32位对数跳跃加法器的最大扇出为5,关键路径为8级逻辑门延迟,结构规整,易于集成.spectre电路仿真结果表明,在0.25μmCMOS工艺下,32位加法器的关键路径延迟为760ps,100MHz工作频率下功耗为5.2mW.     

超前进位加法器的优化设计

在对超前加法器逻辑算法分析的基础上,介绍了一种优化设计方法。宽位加法器采用多层CLA（ Carry Look-ahead Adder）块技术,按四位为一组进行组间超前进位,减小硬件延时,达到并行、高速的目的。并在晶体管级重点对全加器进行优化设计,从而降低整个电路的延时、面积和功耗。仿真结果表明,在SMIC65 nm工艺下,设计出的16位超前进位加法器,其延时,面积,功耗相比传统结构都有了明显的改善,达到了优化的效果。     

对数跳跃加法器的静态CMOS实现

介绍了一种32位对数跳跃加法器结构.该结构采用EL M超前进位加法器代替进位跳跃结构中的组内串行加法器,同EL M相比节约了30 %的硬件开销.面向该算法,重点对关键单元进行了晶体管级的电路设计.其中的进位结合结构利用L ing算法,采用支路线或电路结构对伪进位产生逻辑进行优化;求和逻辑的设计利用传输管结构,用一级逻辑门实现“与-异或”功能;1.0 μm CMOS工艺实现的32位对数跳跃加法器面积为0 .6 2 mm2 ,采用1μm和0 .2 5 μm工艺参数的关键路径延迟分别为6 ns和0 .8ns,在10 0 MHz下功耗分别为2 3和5 .2 m W.     

64位超前进位对数加法器的设计与优化

设计一个应用于高性能微处理器的快速64位超前进位对数加法器.通过分析超前进位对数加法器原理,提出了改进四进制Kogge-Stone树算法的64位超前进位对数加法器结构,并结合使用多米诺动态逻辑、时钟延迟多米诺逻辑和传输门逻辑等技术来设计和优化电路.该加法器采用SMIC 0.18 μm CMOS工艺实现,在最坏情况下完成一次加法运算时间为486.1 ps,与相同工艺和相同电路结构采用静态CMOS实现相比,大大减少了加法器各级门的延迟时间,取得良好的电路性能.     

对数跳跃加法器的静态CMOS实现

介绍了一种32位对数跳跃加法器结构.该结构采用ELM超前进位加法器代替进位跳跃结构中的组内串行加法器,同ELM相比节约了30%的硬件开销.面向该算法,重点对关键单元进行了晶体管级的电路设计.其中的进位结合结构利用Ling算法,采用支路线或电路结构对伪进位产生逻辑进行优化;求和逻辑的设计利用传输管结构,用一级逻辑门实现"与-民或"功能;1.0μm CMOS工世实现的32位对数跳跃加法器面积为0.62mm2,采用1μm和0.25μm 工世参数的关键路径延迟分别为6ns和0.8ns,在100MHz下功耗分别为23和5.2mW.     

High performance 8 bit cascaded carry look ahead adder with precise power consumption

Multiple bit adders like ripple carry adder make the propagation of carry bit very slow and this is the reason why it must be replaced with fast adders as carry‐look‐ahead adder (CLA). Power consumption in digital circuits depends on the number of metal–oxide–semiconductor field‐effect transistor employed and various other parameters. If number of metal–oxide–semiconductor field‐effect transistor is reduced the power consumption would definitely be reduced. Conventional CLAs would consume significant amount of power that still needs to be improved. The paper here deals with the implementation of 8 bit CLA with the aim of reducing the size and to precise the power consumption within nanowatt range, by improving the fundamental components of the circuit. All the parameters have been calculated by using Cadence Virtuoso tool at 45 nm technology. Copyright © 2014 John Wiley & Sons, Ltd.     

用于加法器的功耗延迟积优化混合进位算法

为了实现高性能的加法器,提出了面向功耗延迟积(PDP)优化的混合进位算法。该算法能快速搜索加法器的混合进位,以优化PDP。采用超前进位算法和行波进位算法交替混合,兼具超前进位算法速度快和行波进位算法功耗低的特点。该算法采用C语言实现并编译,结果应用于MCNC Benchmark电路,进行判定测试。与应用三种传统算法的加法器相比,应用该算法的加法器在位数为8位、16位、32位和64位时,PDP改进量分别为40.0%、70.6%、85.6%和92.9%。     

Easily Testable Cellular Carry Lookahead Adders

Cellular Carry Lookahead (CLA) adders are systematically implemented in arithmetic units due to their regular, well-balanced structure. In terms of testability and with respect to the classical Cell Fault Model (CFM), cellular CLA adders have poor testability by construction. Design-for-testability (DFT) modifications for cellular CLA adders have been proposed in the literature providing complete CFM testability making the adders either level-testable or C-testable. These designs impose significant area and performance overheads. In this paper, we propose DFT modifications for cellular CLA adders to achieve complete CFM testability with special emphasis on the minimum impact in terms of area and performance. Complete CFM testability is achieved without adding any extra inputs to the adder, with very small area and performance overheads, thus providing a practical solution. The proposed DFT scheme requires only 1 extra output and it is not necessary to put the circuit in a special test mode, while the earlier schemes require the addition of 2 extra inputs to set the circuit in test mode. A rigorous proof of the linear-testability of the adder is given and a sufficient linear-sized test set is provided that guarantees 100% CFM fault coverage. Surprisingly, the size of the proposed linear-sized test set is, in most practical cases, comparable or even smaller than a logarithmic-sized test set proposed in the literature.     

基于模块化结构的N位加法器的测试生成

针对单个ｓｔｕｃｋ－ａｔ故障，研究了Ｎ位加法器的测试矢量生成问题，对于行波进位加法器，只需８个测试矢量就可得到１００％的故障覆盖率；对于Ｎ位先行进位加法器，只需Ｎ＾２＋２Ｎ＋３个测试矢量即可得到１００％的故障覆盖率。     

Evaluation of three 32-bit CMOS adders in DCVS logic for self-timedcircuits

The efficient implementation of adders in differential logic can be carried out using a new generate signal (N) presented in this paper. This signal enables iterative shared transistor structures to be built with a better speed/area performance than a conventional implementation. It also allows adders developed in domino logic to be easily adapted to differential logic. Based on this signal, three 32-b adders in differential cascode switch voltage (DCVS) logic with completion circuit for applications in self-timed circuits have been fabricated in a standard 1.0-μm two-level metal CMOS technology. The adders are: a ripple-carry (RC) adder, a carry look-ahead (CLA) adder, and a binary carry look-ahead (BCL) adder. The RC adder has the best levels of performance for random input data, but its delay is significantly influenced by the length of the carry propagation path, and thus is not recommended in circuits with nonrandom input operands. The BCL adder is the fastest but has a high cost in chip area. The CLA adder provides an intermediate option, with an area which is 20% greater than that of the RC adder. Its average delay is slightly greater than that of the other two adders, with an addition time which increases slowly with the carry propagate length even for adders with a high number of bits     

Fast and gate-count efficient arithmetic logic unit

A CMOS arithmetic logic unit is presented with a minimum number of transistors and high speed arithmetic operations. Multiple carry chain adders and a novel 1 bit adder, are used in a carry select adder. The carry chain adder has a high degree of shared gates with a low propagation delay