共查询到20条相似文献,搜索用时 62 毫秒
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设计了与CMOS工艺兼容的光电单片接收机电路,其中包括光电探测器、前置放大器和主放大器.它采用0.6μm CMOS工艺,可在自备的高阻外延片上使用MPW(multi-project wafer)进行流水.其中光电探测器的工作波长为850nm,响应度为0.2A/W,接收灵敏度为-16dBm,带宽为800MHz,因此适用于VSR(very short reach)系统.前置放大器采用电流模反馈放大器,主放大器输出为LVDS(low voltage differential signals)电平.通过器件模拟与电路模拟统一的方法将光电探测器与接收机放大电路进行统一模拟,分析了电路的限制因素,并提出了相应的改进方法. 相似文献
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标准CMOS工艺下Si光电探测器的模拟与设计 总被引:1,自引:0,他引:1
设计了与标准CMOS工艺兼容的硅双光电探测器,并从理论上计算和分析了其绝对光谱响应.0.5μm CMOS工艺条件数值模拟结果显示,在无抗反射膜情况下该探测器在400~900nm波长范围内响应度都在0.2A/W以上,尤其是在短波长处效果比一般的探测器要好.还就反向偏压以及CMOS工艺中介质与钝化层等因素对探测器响应度的影响进行了讨论. 相似文献
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CMOS兼容光电单片接收机的模拟与设计 总被引:2,自引:0,他引:2
设计了与CMOS工艺兼容的光电单片接收机电路,其中包括光电探测器、前置放大器和主放大器.它采用0 6μmCMOS工艺,可在自备的高阻外延片上使用MPW(multi project wafer)进行流水.其中光电探测器的工作波长为850nm ,响应度为0 2A/W ,接收灵敏度为- 1 6dBm ,带宽为80 0MHz ,因此适用于VSR(very short reach)系统.前置放大器采用电流模反馈放大器,主放大器输出为LVDS(low voltage differential signals)电平.通过器件模拟与电路模拟统一的方法将光电探测器与接收机放大电路进行统一模拟,分析了电路的限制因素,并提出了相应的改进方法. 相似文献
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硫化铅探测器具有短波红外高灵敏度、低俄歇噪声等优点,其中化学水浴法合成的硫化铅薄膜可与CMOS半导体工艺兼容,有利于实现低成本高性能的面阵探测器。然而,目前对化学水浴法合成硫化铅探测器的研究主要集中在较大尺寸的单元探测器。本文基于化学水浴法合成硫化铅薄膜,利用离子束刻蚀工艺,制备了10~200μm尺寸的硫化铅光电探测器,研究了器件光电性能随电阻、长宽比、线宽等参数的变化。结果表明,随着尺寸的减小,硫化铅光电探测器的响应度逐渐增加,在1550 nm短波红外光的照射下,10μm级器件的响应度达到了51.68 A/W,约为200μm级器件的123倍,且在可见光和2.7μm红外波长下也具有良好的宽波段光电响应。本文研究的微米尺寸探测器件可为硫化铅探测器研究提供一定的支撑。 相似文献
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Meihua Shen Wilfred Pau Nicolas Gani Jianping Wen Shashank Deshmukh Thorsten Lill Jian Zhang Hanming Wu Guqing Xing 《半导体技术》2004,29(8)
This paper presents a brief overview of the Applied Centura(R)DPS(R)system,configured with silicon etch DPS Ⅱ chamber, with emphasis on discussing tuning capability for CD uniformity control. It also presents the studies of etch process chemistry and film integration impact for an overall successful gate patterning development. Discussions will focus on resolutions to key issues, such as CD uniformity, line-edge roughness, and multilayer film etching integration. 相似文献
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White organic light-emitting devices based on fac tris(2- phenylpyridine) iridium sensitized 5,6,11,12-tetraphenylnap -hthacene 总被引:1,自引:0,他引:1
We have fabricated the white organic light-emitting devices (WOLEDs) based on 4,4' -bis(2,2 -diphenyl vinyl)-1,1' - biphenyl (DPVBi) and phosphorescence sensitized 5,6,11,12,-tetraphenylnaphthacene (rubrene). The device structure is ITO/2T-NATA (20 nm)/NPBX (20 nm)/CBP: x%Ir(ppy)3:0.5% rubrene (8 nm)/NPBX (5 nm)/DPVBi (30 nm)/Alq(30 nm)/LiF(0.5 nm)/A1. In the devices, DPVBi acts as a blue light-emitting layer, the rubrene is sensitized by a phosphorescent material, fac tris (2-phenylpyridine) iridium [Ir(ppy)3], acts as a yellow light-emitting layer, and N,N' -bis- (1-naphthyl)- N,N' -diphenyl -1, 1' -biphenyl-4,4' -diamine (NPBX) acts as a hole transporting and exciton blocker layer, respectively. When the concentration of Ir (PPY)3 is 6wt%, the maximum luminance is 24960 cd/m^2 at an applied voltage of 15 V, and the maximum luminous efficiency is 5.17 cd/A at an applied voltage of 8 V. 相似文献
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Complete approach to automatic identification and subpixel center location for ellipse feature 总被引:1,自引:0,他引:1
XUE Ting WU Bin SUN Mei YE Sheng-hua 《光电子快报》2008,4(1):51-54
To meet the need of automatic image features extraction with high precision in visual inspection, a complete approach to automatic identification and sub-pixel center location for similar-ellipse feature is proposed. In the method, the feature area is identified automatically based on the edge attribute, and the sub-pixel center location is accomplished with the leastsquare algorithm. It shows that the method is valid, practical, and has high precision by experiment. Meanwhile this method can meet the need of instrumentation of visual inspection because of easy realization and without man-machine interaction. 相似文献
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In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal (200) (2d = 0.4027 nm) is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line(w), the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line(x), the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines(y), the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line(z) in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line(q) in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution(λ/△ 2) is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy. 相似文献
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High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET > PDMAT > TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center. 相似文献
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This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors. 相似文献
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Credence Systems Corporation 《半导体技术》2004,29(9)
Integrated circuits (ICs) intended for increasingly sophisticated automotive applications bring unique test demands. Advanced ICs for applications such as highly integrated automatic braking system (ABS) and airbag controllers combine high voltage digital channels, significant VI demands and precise timing capability. Along with continued missioncritical reliability concerns, the trend toward higher voltage operation and increased device integration requires specialized test capabilities able to extend across the wide operating ranges found in automotive applications. Among these capabilities, automotive test requirements increasingly dictate a need for a cost-effective versatile mixed-signal pin electronics with very high data rates reaching up to 50MHz with a voltage swing of-2 V to +28 V. 相似文献
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YUXiao-hua XIANGYu-qun 《半导体技术》2005,30(2):30-32,37
An improving utilization and efficiency of critical equipments in semiconductor wafer fabrication facilities are concerned. Semiconductor manufacturing FAB is one of the most complicated and cost sensitive environments. A good dispatching tool will make big difference in equipment utilization and FAB output as a whole. The equipment in this paper is In-Line DUV Scanner. There are many factors impacting utilization and output on this equipment group. In HMP environment one of the issues is changing of reticule in this area and idle counts due to load unbalance between equipments. Here we'll introduce a rule-based RTD system which aiming at decreasing the number of recipe change and idle counts among a group of scanner equipment in a high-mixed-products FAB. 相似文献
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It is of interest to get appropriate information about the dynamic behaviour of rotating machinery parts in service. This paper presents an approach of optical vibration and deviation measurement of such parts. Essential of this method is an image derotator combined with a high speed camera or a laser doppler vibrometer (LDV). 相似文献